2001
DOI: 10.1109/77.919884
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Properties of YBa/sub 2/Cu/sub 3/O/sub 7/ thin films deposited on substrates and bicrystals with vicinal offcut and realization of high I/sub c/R/sub n/ junctions

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Cited by 56 publications
(36 citation statements)
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“…All our SPM data confirm that the roughness of a 250 nm thick YBaCuO tilted film on sapphire is 1.5 times less than those of 100 nm thick films on tilted SrTiO 3 and NdGaO 3 substrates. 9,10 The roughness increases with increasing thickness and the difference in roughness should be even higher in favor of our films on sapphire if equal film thicknesses were considered. We can conclude that a low roughness adds to the advantages of tilted sapphire substrates.…”
Section: Film Deposition Characterization and Junction Patterningmentioning
confidence: 99%
“…All our SPM data confirm that the roughness of a 250 nm thick YBaCuO tilted film on sapphire is 1.5 times less than those of 100 nm thick films on tilted SrTiO 3 and NdGaO 3 substrates. 9,10 The roughness increases with increasing thickness and the difference in roughness should be even higher in favor of our films on sapphire if equal film thicknesses were considered. We can conclude that a low roughness adds to the advantages of tilted sapphire substrates.…”
Section: Film Deposition Characterization and Junction Patterningmentioning
confidence: 99%
“…[4][5][6][7] At this stage, few studies on the structural and transport properties of JJs generated on substrates tilted around a-b planes have been presented. 8,9 The properties of these geometries have been more extensively studied in JJs fabricated by a biepitaxial technique which has shown to be a good option for the implementation of a reliable technology based on the Joshepson effect. [10][11][12] The structure of the barrier depends on many factors like the misorientation angle between the two electrodes, the orientation of the interface plane with respect to crystallographic axes, and the meandering at the barrier, so no prediction of the exact boundary structure is possible.…”
Section: Introductionmentioning
confidence: 99%
“…Thus, for RBJ it is known that the magnitude of characteristic voltage V c varies slightly in a large range of misorientation angles up to 633 , while normal resistance at the same time can increase by an order of magnitude. 38 Note that when a ¼ 645 the current j c is strongly suppressed, and V c is reduced by an order of magnitude reaching 0.5 mV at liquid-helium temperature. 39 For TBJ the experiment revealed a much stronger angular dependence: with increasing misorientation angle by 6 the parameter V c decreased by more than three times.…”
Section: B Electrophysical Properties Of Bicrystal Junctionsmentioning
confidence: 98%