2009
DOI: 10.1016/j.jcrysgro.2009.08.034
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Properties of surface and interface structure of AlN/3C–SiC/Ge/Si (111) heterostructure

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Cited by 2 publications
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“…The surface and backside of the polished glass-ceramics were also scanned in XRD to determine the oriented growth facets of crystallites. The similar method was applied to detect the thin film coating [18]. The macroscopic piezoelectric constant, d 33 , was then measured in a quasi-static d 33 meter (ZJ-2), recorded in Table 1 …”
Section: Methodsmentioning
confidence: 99%
“…The surface and backside of the polished glass-ceramics were also scanned in XRD to determine the oriented growth facets of crystallites. The similar method was applied to detect the thin film coating [18]. The macroscopic piezoelectric constant, d 33 , was then measured in a quasi-static d 33 meter (ZJ-2), recorded in Table 1 …”
Section: Methodsmentioning
confidence: 99%