In this research, CuGaO2 thin films were prepared on quartz substrates by a radio frequency magnetron sputtering technique at 400℃ followed by subsequent annealing in N2 ambience. The effects of annealing temperature on structural, morphological, optical, and electrical properties of CuGaO2 thin films is reported. X-ray Diffraction (XRD) analysis confirmed the presence of single phase CuGaO2 in the film annealed at 900℃. Near stoichiometric composition ratio of Cu:Ga (1:1.08) was identified in the film annealed at 900℃. Field emission scanning electron microscopy showed an increase in the grain size with increase in annealing temperature. A UV-Vis spectrophotometer was used to perform optical studies in the 200-800nm wavelength region on all films. The optical bandgap was calculated from the transmission studies and was found to be in the range of 2.77 to 3.43 eV. The films annealed at temperatures 800℃ and above were found to be p-type. The lowest resistivity value of 230 Ω-cm was achieved for the film annealed at 900℃.