Promoting X-ray scattering data analysis with two-dimensional correlation spectroscopy

Abstract

In situ X-ray scattering (XrS) experiments provide an impressive level of detail about microstructures and their evolution following a change in environment in soft matter; however, a major obstacle is examining the huge amount of data. In this work, the applications of two-dimensional correlation spectroscopy (2DCS) in the XrS data analysis are demonstrated with three exemplary studies. The responses of three typical soft-matter systems (thin film, solution and solid) to a change in environment (i.e. concentration, temperature) were chosen as the subjects of this study. In situ grazing-incidence small-angle X-ray scattering, small-angle X-ray scattering and wide-angle X-ray scattering results were analyzed with the 2DCS method. On the basis of Noda's rule, it is demonstrated that the 2DCS-XrS results could not only disclose the weak scattering signal common to organic-based materials but also determine the sequential order of the structures of interest by referring to their strong response to a change in environment. It is expected that the 2DCS method could promote XrS data analysis in a simple, fast and reliable way, which might interest users without extensive X-ray scattering knowledge. These features could help to convert XrS data into knowledge that can be implemented in advanced materials preparation.