Promising materials of acoustoelectronics

Рощупкин, Д. В.; Иржак, Д. В.; Емелин, Е. В.; Fakhrtdinov, R. R.; Бузанов, О. А.; Sakharov, S.

doi:10.1134/s1063739713080131

Search citation statements

Order By: Relevance

Paper Sections

Select...

Introduction1

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2020

Publication Types

Select...

Article1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

(1 citation statement)

References 9 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Methods of high-resolution X-ray diffractometry and topography were applied by Roshchupkin et al (2008) (BESSY, Berlin) to study acoustic properties of lanthanum gallium tantalate crystals (LGT, langatate, La 3 Ga 5.5 Ta 0.5 O 14 ) and polar properties of ferroelectric crystals of lithium niobate and lithium tantalate (LiNbO 3 and LiTaO 3 ) (Roshchupkin et al, 2013).…”

Section: Introductionmentioning

confidence: 99%

Measurement of single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π

et al. 2020

View full text Add to dashboard Cite

This article presents measurements of the piezoelectric modulus d 11 of a single crystal of lanthanum gallium silicate (LGS, La 3 Ga 5 SiO 14 ). The piezoelectric modulus was measured by X-ray diffraction at angles close to backscattering. Experiments in such schemes are very sensitive to relative changes in the lattice constant in crystals caused by external influences (constant or alternating electric field, mechanical load, temperature change etc.). The development opportunity of the technique is shown, its applicability is evaluated and results of measurement of the LGS single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near are discussed.

show abstract

Section: Introductionmentioning

confidence: 99%