Progress in Bulk Texture Measurement Using Neutron Diffraction

Abstract

The current status of bulk texture measurements both using angle dispersive neutron diffraction and time-of-flight neutron diffraction at JAEA was briefly reviewed, then the effect of sample orientation coverage in the time-of-flight neutron diffraction on the reliability of reconstructed pole figure on the reliability of reconstructed pole figure was simply compared after the simultaneous Rietveld texture analysis. The similar texture results obtained at different orientation coverage levels suggests that it is possible to reduce the sample rotation times reasonably during the bulk texture measurement.

A far-field scattering model in textured polycrystals with ellipsoidal grains of arbitrary crystal symmetry

“…The Gaussian ODF is favorable for wave scattering modeling, especially for the illustration of texture impact on wave scattering [26, 35]. However, most experimental texture analyses, such as X ray diffraction, neutron diffraction, and orientation imaging microscopy (OIM), adopt generalized spherical harmonics [30, 43, 44]; one may convert the generalized spherical harmonics ODF to the Gaussian ODF when the texture component is simple, for example, a fiber texture [34, 42].…”