Abstract:High-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) is highly sensitive to the type and number of atoms in the atomic columns of a sample. Image contrast in HAADF-STEM agrees quantitatively with image simulations [1]. An important complementary method in STEM is position averaged convergent beam electron diffraction (PACBED), which is highly sensitive to information that cannot easily be obtained from HAADF-STEM images, such as small displacements of atom or tilts of oxygen o… Show more
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