Prognostics of Failures in Embedded Planar Capacitors using Model-Based and Data-Driven Approaches

Abstract

This paper presents the application of model-based and data-driven approaches for prognostics of failures in embedded planar capacitors. An embedded planar capacitor is a thin laminate that serves both as a power/ground plane and as a parallel plate capacitor in a multilayered printed wiring board. These capacitors have gained importance with an increase in the operating frequency and a decrease in the supply voltage in electronic circuits since they can enable miniaturization of electronic circuits as well as improved electrical performance. In next generation electronic circuits, embedded planar capacitors will be crucial in communication, automotive, military, medical, and space applications. The capacitor laminate used in this study consisted of an epoxy-barium titanate nanocomposite dielectric sandwiched between Cu layers. Three electrical parameters, capacitance, dissipation factor, and insulation resistance, were monitored in situ during testing under elevated temperature and voltage-aging conditions. The failure modes observed were a sharp drop in insulation resistance and a gradual decrease in capacitance. An approach to model the time-to-failure associated with these failure modes is presented in this paper. Further, a data-driven technique known as the Mahalanobis distance method is also investigated for early detection of these failures.

O envelhecimento de capacitores em circuitos eletrônicos

“…Essa redução provoca um aumento da Resistência Equivalente em Série e decréscimo no valor da capacitância (LEITE et al, 2007), (CELAYA et al, 2011), (ALAM et al, 2011.…”

Feature extraction for latent fault detection and failure modes classification of board-level package under vibration loadings

“…On one hand, failures due to vibration in electronic packages can occur at various locations in different package structures and have a variety of failure modes [8], and the vibration environment also vary from case to case. So the finite element analysis (FEA) method that adopted by many researchers [9][10][11] may be time consuming and the model-based PHM approaches were not a suitable choice in practice due to a large uncertainty [12]. In this paper, a combination of artificial intelligence and statistic algorithms was used to improve the efficiency and adaptability.…”

Effects of moisture absorption on the electrical parameters of embedded capacitors with epoxy-BaTiO3 nanocomposite dielectric

“…1) are embedded inside multilayered PWBs and have been found to reduce the number of surface mount capacitors [4] and also improve the electrical properties of PWBs [5]. These improvements have been achieved as a result of the low parasitic inductance [6] of embedded capacitors due to the elimination of leads and traces.…”