2023
DOI: 10.1016/j.actbio.2023.08.006
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Profiling to Probing: Atomic force microscopy to characterize nano-engineered implants

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Cited by 11 publications
(5 citation statements)
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“…Roughness values (Ra) were calculated by the software of the AFM and reported in nanometers [ 28 ]. Surface roughness analysis by AFM was chosen in this study due to its precise imaging quality and great ability to analyse, revealing vital details about topography, which affects osseointegration, stability, and biocompatibility for improved biomedical outcomes [ 29 , 30 ].…”
Section: Methodsmentioning
confidence: 99%
“…Roughness values (Ra) were calculated by the software of the AFM and reported in nanometers [ 28 ]. Surface roughness analysis by AFM was chosen in this study due to its precise imaging quality and great ability to analyse, revealing vital details about topography, which affects osseointegration, stability, and biocompatibility for improved biomedical outcomes [ 29 , 30 ].…”
Section: Methodsmentioning
confidence: 99%
“…A comprehensive understanding of the basic modes and advanced applications of AFM was presented by [262]. A paper performed by [263] further emphasized the application of AFM in characterizing nano-engineered implants. Another study provided by [264] used AFM in the measurements of nanoscale mechanical properties of cement pastes.…”
Section: Atomic Force Microscopy: Provides Nanoscale Surface Profilin...mentioning
confidence: 99%
“…Utilizing a single instrument, namely atomic force microscopy (AFM), enables the simultaneous acquisition of nanomechanical and topographical data from nanostructured surfaces [1]. Using the same instrument for all surface analysis is not only efficient, but data are also calibrated parallel to each other in a comparable format and in the same environment using the same measuring probe.…”
Section: Introductionmentioning
confidence: 99%