2018
DOI: 10.1134/s1063782618120072
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Production of Si- and Ge-Based Thermoelectric Materials by Spark Plasma Sintering

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Cited by 7 publications
(8 citation statements)
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“…The sintered ingots of Si0.65Ge0.35Sbδ were cut into plates on which phase composition studies using X-ray diffraction (XRD) analysis, as well as measurements of thermoelectric coefficients were performed. The Seebeck coefficient was calculated from simultaneous temperature and thermoelectric voltage measurements using chromel-alumel thermocouples [11]. The resistivity was measured by the standard fourprobe method.…”
Section: Methodsmentioning
confidence: 99%
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“…The sintered ingots of Si0.65Ge0.35Sbδ were cut into plates on which phase composition studies using X-ray diffraction (XRD) analysis, as well as measurements of thermoelectric coefficients were performed. The Seebeck coefficient was calculated from simultaneous temperature and thermoelectric voltage measurements using chromel-alumel thermocouples [11]. The resistivity was measured by the standard fourprobe method.…”
Section: Methodsmentioning
confidence: 99%
“…The measurements were carried out in the temperature range of Тm = 50-490 °С. The technology for structures fabrication, as well as all measurement techniques, are described in detail in [7,11]. Lines associated with Sb were not resolved due to low concentration.…”
Section: Methodsmentioning
confidence: 99%
“…The sintered ingots of Si 0.65 Ge 0.35 Sb δ were cut into plates on which phase composition studies using X-ray diffraction (XRD) analysis, as well as measurements of thermoelectric coefficients were performed. The Seebeck coefficient was calculated from simultaneous temperature and thermoelectric voltage measurements using chromelalumel thermocouples [12]. The resistivity was measured by the standard four-probe method.…”
Section: Methodsmentioning
confidence: 99%
“…The thermal conductivity was measured by the stationary heat flux method [13]. The measurements were carried out at temperatures ranging from T m = 50 -490 • C. The technology for structures fabrication, as well as all measurement techniques, are described in detail in [7,12]. Figure 1 shows X-ray diffraction spectra of the initial powder (1) and samples (1,3,5) fabricated at various temperatures.…”
Section: Methodsmentioning
confidence: 99%
“…Over the last two decades, much attention has been paid to the development and study of nanostructured and fine-grained thermoelectric materials [1][2][3][4][5][6][7][8]. Siliconand germanium-based compounds -Si 1−x Ge x [1,[4][5][6][7] have a special place among them.…”
Section: Introductionmentioning
confidence: 99%