2011 IEEE International Conference on Quality and Reliability 2011
DOI: 10.1109/icqr.2011.6031733
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Process yield improvement on the gram load adjusting process of a suspension manufacturer

Abstract: This paper presents the improvement on the process yield of gram load adjustment by utilizing the six sigma concept. In define phase, the objective of this study is to increase the yield of this process. Currently, a process yield is 98.59%. The root cause analysis tools including Cause & Effect Diagram, Cause & Effect Matrix, and FMEA are employed to determine the key process input variables (KPIVs). There are 6 potential KPIVs selected into this study. Then, the design of experiment is conducted to investiga… Show more

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Cited by 3 publications
(5 citation statements)
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References 6 publications
(8 reference statements)
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“…To screen factors, a one half-fraction 2 6-1 design that gives the resolution VI is applied. The resolution VI of this design is enough to provide us the information about main effects and interactions [5,6]. This single replicate 2 6-1 design and 1 center point requires the total of 33 observations.…”
Section: Experimental Designs and Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…To screen factors, a one half-fraction 2 6-1 design that gives the resolution VI is applied. The resolution VI of this design is enough to provide us the information about main effects and interactions [5,6]. This single replicate 2 6-1 design and 1 center point requires the total of 33 observations.…”
Section: Experimental Designs and Resultsmentioning
confidence: 99%
“…In an electronic industry, an experimental design has been wildly used. Asawarungsaengkul et al [1] applied a full factorial design to determine factors that significantly affect incomplete welding problem at a laser spot welding process. With a new process setting, the defective rate was reduced from 0.5472% or 5,472 DPPM to 0.1775% or 1,775 DPPM.…”
Section: Introductionmentioning
confidence: 99%
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“…There are various applications of cost reduction through quality improvement in electronics as shown by failure analysis of ultrasonic pitting and carbon voids on magnetic recording disks [1] aimed to reduce carbon voids and ultrasonic power for improve disks quality, defect reduction of patterned media templates and disks [2] with respect to inspection methodology of hard disk pattern using jet and flash imprint lithography and characteristic and reduction of a new particle defect mode in sub-0.25 µm semiconductor process flow [3]. Six Sigma has been wildly and increasingly accepted in electronics and computer industries as a tool for the cost reduction through process improvement [4,5,6,7] due to its systematic procedures based on the statistical analysis [8].…”
Section: Introductionmentioning
confidence: 99%
“…The Six sigma approach has been wildly and increasingly accepted as a tool for process or efficiency improvement [1] due to its systematic procedures based on the statistical analysis. According to electronics and computer industries, there are various process improvements under Six sigma approach [2,3,4,5]. With the preliminary survey, the number of defectives of the studying HDD company is very high and a few process are not efficient.…”
Section: Introductionmentioning
confidence: 99%