2010
DOI: 10.1016/j.mejo.2009.12.013
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Process variation-aware performance analysis of asynchronous circuits

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Cited by 5 publications
(6 citation statements)
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“…However, adaptations of asynchronous timing models already started to deal with process variations, as proposed e.g. by Raji et al [53]. The basic idea of the cited work is to change the often used deterministic Timed Petri Nets (TPN) model to describe asynchronous concurrent behavior by probabilistic models such as the Variant-Timed Petri Net (VPTN) model [53].…”
Section: Robustness To Process and Temperaturementioning
confidence: 99%
“…However, adaptations of asynchronous timing models already started to deal with process variations, as proposed e.g. by Raji et al [53]. The basic idea of the cited work is to change the often used deterministic Timed Petri Nets (TPN) model to describe asynchronous concurrent behavior by probabilistic models such as the Variant-Timed Petri Net (VPTN) model [53].…”
Section: Robustness To Process and Temperaturementioning
confidence: 99%
“…In order to overcome issues such as channel crosstalk, clock feedthrough and power wasting, an asynchronous mode of digital low-pass ltering was chosen [14,15]. The last stage of the ROIC channel of Fig.…”
Section: Digital First-order Filteringmentioning
confidence: 99%
“…In the present case, the multi-channel system we deal with is an infrared (IR) gas analyzer. Its principle of operation is based on the spectroscopic gas Preprint submitted to Microprocessors and Microsystems: embedded hardware designDecember 15,2011 http://dx.doi.org/10.1016/j.micpro.2012.02.011 recognition [5], which is done by means of passing an IR light beam through a chamber with the gas under test. An array of IR sensors and optical lters on the chamber's output measures the light power on dierent infrared frequencies.…”
Section: Introductionmentioning
confidence: 99%
“…There are many techniques to design dual-V th synchronous circuits (Srivastava and Sylvester, 2004). However, these techniques cannot be applied directly to asynchronous logic in the same way that it can be done for synchronous circuits (Raji et al , 2010). It is due to because of the fact that it is difficult to define or to identify a critical path in asynchronous circuits, where it starts, where it stops, at least with a computer-aided design tool that has been designed for synchronous circuits.…”
Section: Introductionmentioning
confidence: 99%
“…However, the work does not consider the impacts of process variation. Earlier, we introduced a statistical leakage power reduction method for asynchronous circuits by using dual-V th technique (Raji et al , 2010). However, all the random variations are modeled as Gaussian processes without considering spatial correlation.…”
Section: Introductionmentioning
confidence: 99%