25th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2014) 2014
DOI: 10.1109/asmc.2014.6846965
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Process monitoring using advanced inspection methodologies - a study with CVD

Abstract: Defect free film deposition is one of the most challenging steps in CMOS manufacturing for 28nm process node and beyond. For precise control over surface, excellent uniformity and accurate material characteristics are required. IC manufacturers find it critical to monitor the film deposition process in terms of layer uniformity and other signatures/defects induced on the surface during the deposition process. In this work, an oxide layer deposited using flowable chemical vapor deposition (FCVD) process on a 30… Show more

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“…Once the fluid film has flown inside the cavities, it is fixed into a solid. [ 189,190 ] The flowing material is silazane which is converted into silica by a remote plasma system. The process is somewhat complex and requires careful parameter control.…”
Section: Related Methods For Cavity Fillingmentioning
confidence: 99%
“…Once the fluid film has flown inside the cavities, it is fixed into a solid. [ 189,190 ] The flowing material is silazane which is converted into silica by a remote plasma system. The process is somewhat complex and requires careful parameter control.…”
Section: Related Methods For Cavity Fillingmentioning
confidence: 99%