2014
DOI: 10.1016/j.electacta.2013.12.083
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Process modeling of the ohmic loss in proton exchange membrane fuel cells

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Cited by 35 publications
(25 citation statements)
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“…Therefore, this equivalent circuit predicts that HFR (which is just an ordinary resistance) is not the only part of the Nyquist plot which is affected by the membrane. In fact, it can be shown [34] that the ohmic loss also affects the low-frequency (LF) arc which is circled in Fig. 1.…”
Section: Semi-process Modeling Approachmentioning
confidence: 97%
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“…Therefore, this equivalent circuit predicts that HFR (which is just an ordinary resistance) is not the only part of the Nyquist plot which is affected by the membrane. In fact, it can be shown [34] that the ohmic loss also affects the low-frequency (LF) arc which is circled in Fig. 1.…”
Section: Semi-process Modeling Approachmentioning
confidence: 97%
“…Assuming this equivalent circuit, these semi-process models have unintentionally supposed that the role of the membrane can only be tracked in HFR. However, using the process modeling approach, it can be shown [34] that the ohmic loss has the impedance in the form Clearly, the block of elements containing C M , R 1,M , R 2,M , and L M has certainly imaginary parts (i.e., (iu) terms due to the capacitive and inductive elements). Therefore, this equivalent circuit predicts that HFR (which is just an ordinary resistance) is not the only part of the Nyquist plot which is affected by the membrane.…”
Section: Semi-process Modeling Approachmentioning
confidence: 99%
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“…16 The remaining inconsistency is explained by a low-frequency inductive loop, the beginning of which can be observed in EIS experiments extended below 0.1 Hz. 15 Several explanations for this low-frequency inductive loop have been given, including water buildup in the membrane, [17][18][19][20][21] buildup of ORR intermediates, [22][23][24] and platinum oxide formation from water. 23,25 The effect of water buildup in the membrane was measured experimentally by Schneider et al, 17,26,27 using a superimposed highfrequency perturbation to monitor conductivity changes during EIS.…”
mentioning
confidence: 99%