2009
DOI: 10.1109/tsmcc.2009.2014169
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Process Mining Applied to the Test Process of Wafer Scanners in ASML

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Cited by 104 publications
(61 citation statements)
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References 14 publications
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“…Many existing precision metrics (e.g., [25,30,34]) do not explicitly take into account possible deviations between the behavior observed in the event log with the behavior modeled in the models, while many case studies show that such deviations often occur in practice (e.g., [11,16,19,20,23,31,35,36]). Thus, these metrics might be biased due to unfitting logs and models.…”
Section: Introductionmentioning
confidence: 99%
“…Many existing precision metrics (e.g., [25,30,34]) do not explicitly take into account possible deviations between the behavior observed in the event log with the behavior modeled in the models, while many case studies show that such deviations often occur in practice (e.g., [11,16,19,20,23,31,35,36]). Thus, these metrics might be biased due to unfitting logs and models.…”
Section: Introductionmentioning
confidence: 99%
“…[4,7,9]) assume that the event log perfectly fits the model, while many case studies show that this assumption does not hold (e.g. [5,8,14]). In this paper, we do not use such assumptions and propose a robust approach to measure the precision between an event log and a model.…”
Section: Introductionmentioning
confidence: 99%
“…Rozinat et al [1] introduced the application of process mining in the test process of ASML's wafer scanner. ASML, is the world's leading manufacturer of chip-making equipment and a key supplier to the chip industry [1].…”
Section: Discussionmentioning
confidence: 99%
“…Currently, MPA is mostly used to monitor the current production process and measure the performance of overall processes. Some of previous works on MPA using process mining showed a comprehensive results (Rozinat et al [1], Son et al [2,3]). However, there are corresponding discussions on more foundational questions related to the importance of discovering process model and the usefulness of process mining in the manufacturing domain (Aalst et al [4]).…”
Section: Introductionmentioning
confidence: 99%