Proceedings of the 2005 IEEE Midnight-Summer Workshop on Soft Computing in Industrial Applications, 2005. SMCia/05.
DOI: 10.1109/smcia.2005.1466969
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Process identification and quality control with evolutionary optimized RBF classifiers

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Cited by 4 publications
(2 citation statements)
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“…requirement (1). The D-S rule complies to this requirement, it is associative and commutative (see [5]).…”
Section: Analysis Of the D-s Rulementioning
confidence: 99%
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“…requirement (1). The D-S rule complies to this requirement, it is associative and commutative (see [5]).…”
Section: Analysis Of the D-s Rulementioning
confidence: 99%
“…Imagine a quality control problem in an industrial production process, e.g., the wafer inspection problem we set out in [1]. A classifier must be trained to detect and distinguish various defect categories such as abrasions, cracks, scratches, or dust particles.…”
Section: Introductionmentioning
confidence: 99%