Single-walled
carbon nanotubes (SWCNTs) incorporated in indium
tin oxide (ITO) were developed to fabricate transparent conductive
thin films via a sol–gel spin coating technique. The fabricated
thin films were annealed at 350 °C. The effects of incorporating
SWCNTs and varying film thickness on crystal structure were systematically
investigated by X-ray diffraction (XRD), Raman shift, surface elemental
compositions, surface topography and roughness, optoelectronic characteristics,
and mechanical properties. XRD results confirmed the body-centered
cubic structure of indium oxide polycrystalline phase, indicating
that the structural properties of the ITO films were not significantly
altered by incorporating CNTs. The presence of CNTs in the ITO matrix
was confirmed by analyses of Raman spectroscopy, X-ray photoelectron
spectroscopy (XPS), and energy dispersive X-ray spectroscopy (EDX).
FESEM images revealed the formation of SWCNTs/ITO nanoparticles, and
the average crystallite size increased along with increasing film
thickness. Electrical characteristics also improved as the film thickness
increased. The lowest electrical resistivity (4.6 × 10–4 Ω cm), as well as the highest carrier concentration (3.3 ×
1020 cm–3) and carrier mobility (41 cm2/V s) were achieved from the 320 nm thick film. However, the
optical transparency decreased from 91 to 87.5% as the film thickness
increased from 150 to 320 nm. The hardness and Young’s modulus
of the prepared samples improved, with the increase of SWCNTs doping
level, and achieved the maximum values of 28 and 306 GPa, respectively.