2017
DOI: 10.1126/sciadv.1700135
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Probing nanocrystalline grain dynamics in nanodevices

Abstract: We demonstrate the concept and experimental method to quantitatively characterize mobile nanograins in RuO2 nanowires.

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Cited by 14 publications
(25 citation statements)
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“…The morphology and lattice structure of the NWs were studied using XRD and high-resolution transmission electron microscopy (HR-TEM). The XRD patterns demonstrated a rutile structure 55 , and the HR-TEM images revealed a polycrystalline lattice structure 56 .…”
Section: Discussionmentioning
confidence: 99%
“…The morphology and lattice structure of the NWs were studied using XRD and high-resolution transmission electron microscopy (HR-TEM). The XRD patterns demonstrated a rutile structure 55 , and the HR-TEM images revealed a polycrystalline lattice structure 56 .…”
Section: Discussionmentioning
confidence: 99%
“…for the ac bridge measurement configuration depicted in Fig. 2 Empirically, to obtain an accurate γ value for a given sample, we write through the free-electron model [27]. Note that extracting γ value by this method excludes any possible contribution from the background noise 0 V S .…”
Section: B Excess Low-frequency Noisementioning
confidence: 99%
“…manifests vibrant TLS phenomena especially in small polycrystalline samples[26,27], where m is the effective electron mass, is the averaged electron scattering cross section, with F k being the Fermi wavenumber. ( ) g E can thus be explicitly expressed in terms of the known electronic parameters and the measured ( ) metal, i.e.,…”
mentioning
confidence: 99%
“…The lock-in technique essentially modulates the low frequency signal due to the DM-CM switching to centre at the carrier frequency, which is high enough to pass through the circuit, and then demodulates to recover the original transition dynamics. Also, modulation to higher frequencies allows the minimisation of the input noise of the current preamplifier [30].…”
Section: Response To a Sinusoidal Voltagementioning
confidence: 99%