Abstract:It is generally impossible to separately measure the resistance of the functional component (i.e., the intrinsic device materials) and the parasitic component (i.e., terminals, interfaces and serial loads) in a two-terminal device. Yet such knowledge is important for understanding device physics and designing device systems. Here, we consider a case where an electric current, temperature, or magnetic field causes a small but identical relative conductivity change ∆σ/σ of the device materials. We find an exact … Show more
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