Probing interfacial and bulk magnetic hysteresis in roughened CoFe thin films

Freeland, J. W.; Bussmann, K.; Lubitz, P.; Idzerda, Y. U.; Kao, C.‐C.

doi:10.1063/1.122424

Cited by 29 publications

(21 citation statements)

References 23 publications

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“…7 Very recently, Freeland et al using the x-ray resonant magnetic scattering studied hysteretic behavior of CoFe thin films with varying roughness. 8 They also found the coercivity increased with the surface roughness. The other kind is a film with double rough boundaries.…”

Section: Introductionmentioning

confidence: 92%

“…Nonetheless, how does the detailed morphology of the surface affects the apparent coercivity was not considered in most experiments. [6][7][8]10 Only a few experiments relate the change in coercivity to the change of the interface width w. Recently, some detailed works have been performed. 5,9 Experiments of Co films: In the following we shall discuss the connection of our theory and our experimental work.…”

Section: Connections With Experimentmentioning

confidence: 99%

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Surface/interface-roughness-induced demagnetizing effect in thin magnetic films

et al. 1999

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Section: Introductionmentioning

confidence: 92%

Section: Connections With Experimentmentioning

confidence: 99%

Surface/interface-roughness-induced demagnetizing effect in thin magnetic films

et al. 1999

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“…Vilain et al 3 investigated the coercivity versus surface roughness of NiCo alloy films and Malyutins et al 4 showed that the coercivity of chemically etched Ni-Fe-Co films increases with the surface roughness. Frealnd et al 5 studied hysteretic behavior of CoFe thin films with varying roughness using the X-ray resonant magnetic scattering. It has been found that, the coercivity increased with the surface roughness.…”

Section: Introductionmentioning

confidence: 99%

Effects of Surface Topography on Magnetization Reversal of Magnetic Thin Films

Girgis¹,

Sp²,

Ml³

2006

J. Nanosci. Nanotech.

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The influence of the created surface roughness on the coercivity of magnetic thin films has been investigated. The magnetic thin films (CoFe and alternatively NiFe) are sputtered on top of smooth substrates that were previously covered with an array of considerably rougher lines with one of these materials Pt, Cu, CoFe, and NiFe. The lines have been patterned using optical lithography into arrays that are deposited with different thicknesses varying between 5 nm-15 nm. The lines have been designed to have a very rough edge and seated in two different angles relative to the wafer edge (zero and 45 degrees). Magneto-optic Kerr effect (MOKE) measurements showed two distinct switching fields in the hysteresis loops that are due to magnetic domain wall trapping created by the surface roughness. The magnetization reversal showed a strong dependence on the height, the orientation angle, and the material's type of the created surface roughness (the lines).

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“…The dependence of the diffuse scattering on the applied magnetic field provides information on the domain structure in the film plane and on the spin disorder at the interfaces [27][28][29]. Hase et al have shown that the diffuse scattering around the half-order magnetic peak in AF coupled magnetic superlattices is of pure magnetic origin [30].…”

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confidence: 98%