2015
DOI: 10.1016/j.fsigen.2015.07.001
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Probabilistic characterisation of baseline noise in STR profiles

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Cited by 22 publications
(19 citation statements)
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“…Noise is an inherent instrument issue that, according to a recent study , occurs at approximately 15% of allelic positions, and when it occurs is best described as a log‐normal distribution. Log‐normal distributions are more prone to large outliers than normal distributions and can generate noise that is of similar peak height to true and stutter products in the presence of low starting template or less numerous rounds of PCR, N PCR .…”
Section: Methodsmentioning
confidence: 99%
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“…Noise is an inherent instrument issue that, according to a recent study , occurs at approximately 15% of allelic positions, and when it occurs is best described as a log‐normal distribution. Log‐normal distributions are more prone to large outliers than normal distributions and can generate noise that is of similar peak height to true and stutter products in the presence of low starting template or less numerous rounds of PCR, N PCR .…”
Section: Methodsmentioning
confidence: 99%
“…Log‐normal distributions are more prone to large outliers than normal distributions and can generate noise that is of similar peak height to true and stutter products in the presence of low starting template or less numerous rounds of PCR, N PCR . For the model, we incorporate the finding by independently adding noise at each allelic position with probability 0.15, whereupon it follows a log‐normal with a per‐locus mean, μ noise , and variance, σ noise 2, taken from . If noise occurs at a position assigned to true or stuttered alleles, its fluorescence is treated as additive.…”
Section: Methodsmentioning
confidence: 99%
“…34 Characterization of reproducible artefacts, such as polymer specific arte-35 facts, is an important part of developmental validations of new STR multiplex 36 kits [25,26]. Although not specifically mentioned in the recommended min- 37 imum criteria for validation [1] it useful to know the type and magnitude of 38 artefacts produced under the specific conditions in the laboratory. 39 Here we present a practical approach to monitor and characterize artefacts 40 and contamination using negative controls.…”
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confidence: 99%
“…The baseline noise was best described by a log-normal 135 distribution (data not shown). Therefore, the AT was estimated according 136 to the formula in Mönich et al[38] reproduced below:…”
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confidence: 99%
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