2022
DOI: 10.3390/electronics11234051
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Probabilistic Analysis of an RL Circuit Transient Response under Inductor Failure Conditions

Abstract: We apply probability theory for the analysis of the exponentially decaying transient response of a resistor inductor electric circuit with partially known value of the inductance due to its failure. The inductance is known to be within a continuous interval, and the exact value is unknown, which may happen as a result of inductor faults due to a variety of factors—for example, when the circuit is deployed in an unusually harsh environment. We consider the inductance as a continuous uniform random variable for … Show more

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Cited by 2 publications
(3 citation statements)
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“…The random variable I o is a derived random variable that depends on the random variable C. From (19)…”
Section: Probability Modelmentioning
confidence: 99%
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“…The random variable I o is a derived random variable that depends on the random variable C. From (19)…”
Section: Probability Modelmentioning
confidence: 99%
“…The capacitance of the capacitor is treated as a random variable and the probability model of the exponentially rising transient response current of the circuit is then developed as a derived random variable. An RL circuit is investigated using the probability methods in [19]. The probability model of the transient response of the circuit is developed, treating the inductor as a random variable.…”
Section: Introductionmentioning
confidence: 99%
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