Prism-Coupled Light Emission from Tunnel Junctions

Ushioda, S.; Rutledge, J. E.; Pierce, R. M.

doi:10.1103/physrevlett.54.224

Cited by 62 publications

(29 citation statements)

References 14 publications

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“…SPP cross-coupling was discussed theoretically by Weber and Mills, 8 and there followed a number of further reports. 9,10 Ushioda et al 11 invoked roughness mediated cross-coupling to explain some of their results on light emitting tunnel junctions but it was Gruhlke et al 12 who first reported the emission of light generated by molecular fluorescence through a corrugated metal film mediated by SPP cross coupling in 1986. The transmission of light through nanostructured metallic films received renewed interest following the report in 1998 by Ebbesen and co-workers 13 of enhanced transmission through metallic films perforated with periodic arrays of subwavelength holes.…”

Section: Introductionmentioning

confidence: 99%

Light emission through a corrugated metal film: The role of cross-coupled surface plasmon polaritons

et al. 2004

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We examine the phenomenon of light emission through a thin metal film that takes place via surface plasmon polaritons. Surface plasmon polariton cross coupling has recently been invoked to explain sharp features observed in the angle dependent emission spectra obtained from surface-emitting (through cathode) organic light-emitting diode structures. We investigated whether such a cross-coupling process is needed to explain such observations. We undertook measurements on samples for a variety of metal film thicknesses. Our results are consistent with the mechanism of surface plasmon polariton cross coupling but also show that the processes underlying the emission from such structures can be rather subtle.

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Section: Introductionmentioning

confidence: 99%

Light emission through a corrugated metal film: The role of cross-coupled surface plasmon polaritons

et al. 2004

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“…We find that a square-shaped grating does not offer a significant improved outcoupling efficiency over a thin (20 nm) thick metal layer, because the island-like surface roughness of the poly-crystalline deposited metal film (with an optimum thickness) already provides some momentum to facilitate outcoupling (Fig. 3e) [26,43]. Optimizing the grating up to about 40x times enhancement in light emission intensity was observed via the sine-shaped grating in comparison to the square shaped grating (Fig.…”

Section: Resultsmentioning

confidence: 95%

Electrical-Driven Plasmon Source of Silicon Based on Quantum Tunneling

2018

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An efficient silicon-based light source presents an unreached goal in the field of photonics, due to Silicon's indirect electronic band structure preventing direct carrier recombination and subsequent photon emission. Here we utilize inelastically tunneling electrons to demonstrate an electrically-driven light emitting silicon-based tunnel junction operating at room temperature. We show that such a junction is a source for plasmons driven by the electrical tunnel current. We find that the emission spectrum is not given by the quantum condition where the emission frequency would be proportional to the applied voltage, but the spectrum is determined by the spectral overlap between the energy-dependent tunnel current and the modal dispersion of the plasmon. Experimentally we find the highest light outcoupling efficiency corresponding to the skin-depth of the metallic contact of this metalinsulator-semiconductor junction. Distinct from LEDs, the temporal response of this tunnel source is not governed by nanosecond carrier lifetimes known to semiconductors, but rather by the tunnel event itself and Heisenberg's uncertainty principle.

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“…[13][14][15][16][17][18] When the proton approaches the surface, a facial density e (r ʈ ) of the surface electrons is modified locally, so that they can screen the Coulomb potential of the proton. Therefore, it is possible for a surface plasmon to couple with a photon via local modulation in the facial electron density.…”

Section: Physical Interpretationmentioning

confidence: 99%

Photon emission from metal surfaces induced by electron capture of slow ions at grazing incidence

Shimizu

1999

Phys. Rev. B

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This paper is a theoretical report on a resonant photon emission process assisted by surface plasmons in the charge-exchange scattering of ions at a metal surface. Slow protons, for example, moving parallel to the surface induce an image charge. A proton and the image charge form an electric dipole at the boundary. When a proton captures a surface electron, the dipole vanishes rapidly, and this necessarily results in a photon emission in accordance with classical electrodynamics. We calculate the photon emission probability in a semiclassical way on the basis of a boundary value problem for a radiation field converted from a surface plasmon excited by the inelastic tunneling current of an electron. Photons with the same frequency as the surface plasmon are emitted dominantly, provided that the energy conservation law is satisfied. The probability is estimated at approximately 0.001 for one collision, which is ϳ10 4 larger than that of the direct photon emission process caused by the inelastic tunneling current.

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Prism-Coupled Light Emission from Tunnel Junctions

Cited by 62 publications

References 14 publications

Light emission through a corrugated metal film: The role of cross-coupled surface plasmon polaritons

Light emission through a corrugated metal film: The role of cross-coupled surface plasmon polaritons

Electrical-Driven Plasmon Source of Silicon Based on Quantum Tunneling

Photon emission from metal surfaces induced by electron capture of slow ions at grazing incidence

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