Introduction to Analytical Electron Microscopy 1979
DOI: 10.1007/978-1-4757-5581-7_3
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Principles of Thin Film X-Ray Microanalysis

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Cited by 118 publications
(23 citation statements)
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“…Analyses by TEM were carried out using the JEOL 2000FX STEM, equipped with a LINK EDX at the NASNJohnson Space Center. Mineral analyses were carried out, using a quantitative EDX, with the Cliff-Lorimer thin-film correction procedure (Goldstein, 1979). These analyses have accuracies in the range of 2 to 5% relative.…”
Section: Methodsmentioning
confidence: 99%
“…Analyses by TEM were carried out using the JEOL 2000FX STEM, equipped with a LINK EDX at the NASNJohnson Space Center. Mineral analyses were carried out, using a quantitative EDX, with the Cliff-Lorimer thin-film correction procedure (Goldstein, 1979). These analyses have accuracies in the range of 2 to 5% relative.…”
Section: Methodsmentioning
confidence: 99%
“…In the final method a fragment of Tagish Lake embedded in EPON8l2 epoxy was vacuum impregnated at 60°C for 1 h, and then polymerized at 60°C for 48 h. After sectioning by ultramicrotomy, thin films were collected on Cu grid coated with collodion and carbon. We observed the samples using a JEOL 2000FX scanning transmission electron microscope (STEM) equipped with a LINK energy dispersive x-ray spectrometer (EDX) analysis system at JSC, and a JEOL 2010 with a Kevex Sigma system EDX at the University of Tokyo, both operating at 200 kV We used natural mineral standards and in-house determined k-factors for reduction of compositional data; a Cliff-Lorimer thin-film correction procedure was employed (Goldstein, 1979). The TEM-EDX analyses are precise to within 1-3% relative.…”
Section: Sample Preparation and Analytical Proceduresmentioning
confidence: 99%
“…We used natural mineral standards and in-house determined k-factors for reduction of compositional data; a Cliff-Lorimer thinfilm correction procedure was employed (Goldstein, 1979). In the case of phyllosilicates, mineral identifications were made on the basis of both composition and electron diffraction data whenever possible.…”
Section: Samples and Analytical Proceduresmentioning
confidence: 99%