Primary current-sensing noise thermometry in the millikelvin regime

Shibahara, Aya; Hahtela, Ossi; Engert, J.; Vliet, Harriet van der; Levitin, L. V.; Casey, A.; Lusher, C. P.; Saunders, J.; Drung, D.; Schurig, T.

doi:10.1098/rsta.2015.0054

Cited by 25 publications

(19 citation statements)

References 22 publications

(47 reference statements)

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Information about the current state of metrology in ultralow temperature thermometry can be found in [25]. More information about techniques that are particularly relevant to micro-/nanoelectronic devices at ultralow temperatures can be found, for example, in [26][27][28] for noise thermometry, [29][30][31][32] for Coulomb blockade thermometry and [33][34][35] for quantum dot-based thermometry. Almost all of the work discussed below makes use of one or more of these thermometry techniques.…”

Section: Introductionmentioning

confidence: 99%

Progress in Cooling Nanoelectronic Devices to Ultra-Low Temperatures

et al. 2020

View full text Add to dashboard Cite

Here we review recent progress in cooling micro-/nanoelectronic devices significantly below 10 mK. A number of groups worldwide are working to produce submillikelvin on-chip electron temperatures, motivated by the possibility of observing new physical effects and improving the performance of quantum technologies, sensors and metrological standards. The challenge is a longstanding one, with the lowest reported on-chip electron temperature having remained around 4 mK for more than 15 years. This is despite the fact that microkelvin temperatures have been accessible in bulk materials since the mid-twentieth century. In this review, we describe progress made in the last 5 years using new cooling techniques. Developments have been driven by improvements in the understanding of nanoscale physics, material properties and heat flow in electronic devices at ultralow temperatures and have involved collaboration between universities and institutes, physicists and engineers. We hope that this review will serve as a summary of the current state of the art and provide a roadmap for future developments. We focus on techniques that have shown, in experiment, the potential to reach sub-millikelvin electron temperatures. In particular, we focus on on-chip demagnetisation refrigeration. Multiple groups have used this technique to reach temperatures around 1 mK, with a current lowest temperature below 0.5 mK.

show abstract

Section: Introductionmentioning

confidence: 99%

Progress in Cooling Nanoelectronic Devices to Ultra-Low Temperatures

et al. 2020

View full text Add to dashboard Cite

show abstract

“…The much higher sensitivity of dc-SQUIDs allowed one to open up the bandwidth and thus speed up the measurement process by several orders of magnitude. Following up this work about 15 years later, practical current noise thermometers were developed and characterized over a wide range of temperatures [35][36][37][38][39][40][41].…”

Section: Introductionmentioning

confidence: 99%

“…For the noise thermometer with the lowest resistance the decoupling starts at about 300 μK , which demonstrates that such a thermometer can be used in relative primary mode down to this temperature. In 2016 Shibahara et al [39] investigated the use of CSNT thermometers in terms of metrology applications and studied the influence of systematic errors originating from amplifier noise, from temperatures dependencies of both the resistance and the inductance of the devices and from the removal of identifiable discrete noise peaks originating from electromagnetic interference. They carefully evaluated all uncertainties and demonstrated in a primary mode measurement a relative uncertainty of 1.53% and very good overall agreement with the PLTS-2000.…”

Section: Introductionmentioning

confidence: 99%

Noise Thermometry for Ultralow Temperatures

2020

View full text Add to dashboard Cite

In recent years, current-sensing dc-SQUIDs have enabled the application of noise thermometry at ultralow temperatures. A major advantage of noise thermometry is the fact that no driving current is needed to operate the device and thus the heat dissipation within the thermometer can be reduced to a minimum. Such devices can be used either in primary or relative primary mode and cover typically several orders of magnitude in temperature extending into the low microkelvin regime. Here we will review recent advances of noise thermometry for ultralow temperatures.

show abstract

“…The microwave circuitry has been kept as basic as possible so far for demonstration purposes; no JPA (Josephson Parametric Amplifier) has been used, and we rely only on intrinsic properties of optomechanics for the measurement [20]. The cryostat reaches temperatures below 500 µK, and is equipped with accurate thermometry from the lowest temperatures up to about 1 K: using a noise SQUID-based (Superconducting QUantum Interference Device) thermometer [21] plus a 3 He-fork thermometer [22].…”

Section: Introductionmentioning

confidence: 99%

On-chip Thermometry for Microwave Optomechanics Implemented in a Nuclear Demagnetization Cryostat

et al. 2019

View full text Add to dashboard Cite

We report on microwave optomechanics measurements performed on a nuclear adiabatic demagnetization cryostat, whose temperature is determined by accurate thermometry from below 500 µK to about 1 Kelvin. We describe a method for accessing the on-chip temperature, building on the blue-detuned parametric instability and a standard microwave setup. The capabilities and sensitivity of both the experimental arrangement and the developed technique are demonstrated with a very weakly coupled silicon-nitride doubly-clamped beam mode of about 4 MHz and a niobium on-chip cavity resonating around 6 GHz. We report on an unstable intrinsic driving force in the coupled microwave-mechanical system acting on the mechanics that appears below typically 100 mK. The origin of this phenomenon remains unknown, and deserves theoretical input. It prevents us from performing reliable experiments below typically 10-30 mK; however no evidence of thermal decoupling is observed, and we propose that the same features should be present in all devices sharing the microwave technology, at different levels of strengths. We further demonstrate empirically how most of the unstable feature can be annihilated, and speculate how the mechanism could be linked to atomic-scale two level systems. The described microwave/microkelvin facility is part of the EMP platform, and shall be used for further experiments within and below the millikelvin range.

show abstract

Primary current-sensing noise thermometry in the millikelvin regime

Cited by 25 publications

References 22 publications

Progress in Cooling Nanoelectronic Devices to Ultra-Low Temperatures

Progress in Cooling Nanoelectronic Devices to Ultra-Low Temperatures

Noise Thermometry for Ultralow Temperatures

On-chip Thermometry for Microwave Optomechanics Implemented in a Nuclear Demagnetization Cryostat

Contact Info

Product

Resources

About