2017
DOI: 10.1103/physrevb.96.134110
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Pressure-induced anomalous enhancement of insulating state and isosymmetric structural transition in quasi-one-dimensional TiS3

Abstract: We present in situ high-pressure synchrotron X-ray diffraction (XRD) and electrical transport measurements on quasi-one-dimensional single crystal TiS 3 up to 29.9-39.0 GPa in diamond anvil cells, coupled with first-principles calculations. Counter-intuitively, the conductive behavior of semiconductor TiS 3 becomes increasingly insulating with pressure till P C1~1 2 GPa, where extremes in all the three axial ratios are observed. Upon further compression to P C2~2 2 GPa, the XRD data evidences a structural phas… Show more

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Cited by 14 publications
(19 citation statements)
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References 35 publications
(31 reference statements)
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“…As an example, we plot in the inset in Figure two successive pressure dependencies of the electrical resistance of sample #2. This feature is consistent with observations of recent high-pressure electrical resistance measurements for TiS 3 that documented its pressure-driven shift to more insulating state . On the other hand, this weak rising in the electrical resistance with pressure might be linked to a minor deterioration in the sample quality under high pressure, which could negatively affect the carrier mobility values because of the formation of many additional defects.…”
Section: Resultssupporting
confidence: 91%
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“…As an example, we plot in the inset in Figure two successive pressure dependencies of the electrical resistance of sample #2. This feature is consistent with observations of recent high-pressure electrical resistance measurements for TiS 3 that documented its pressure-driven shift to more insulating state . On the other hand, this weak rising in the electrical resistance with pressure might be linked to a minor deterioration in the sample quality under high pressure, which could negatively affect the carrier mobility values because of the formation of many additional defects.…”
Section: Resultssupporting
confidence: 91%
“…This feature is consistent with observations of recent high-pressure electrical resistance measurements for TiS 3 that documented its pressure-driven shift to more insulating state. 66 On the other hand, this weak rising in the electrical resistance with pressure might be linked to a minor deterioration in the sample quality under high pressure, which could negatively affect the carrier mobility values because of the formation of many additional defects. A resembling but much more pronounced behavior was observed, for example, for fragile organic conductors.…”
Section: Resultsmentioning
confidence: 99%
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