1997
DOI: 10.1016/s0040-6090(96)09165-1
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Preparation, structure and properties of MoSx films

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Cited by 77 publications
(39 citation statements)
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“…A linear dimension in the order of 10 to 20 basal planes was roughly calculated. The value and also the XRD pattern itself corresponds well to the calculated patterns of G. Weise et al [8]. Measurements of the 100 and 110 pole figures showed constant integral intensity which means there is a random orientation of the structural units without any texture.…”
Section: Coatings By Magnetron Sputteringsupporting
confidence: 86%
“…A linear dimension in the order of 10 to 20 basal planes was roughly calculated. The value and also the XRD pattern itself corresponds well to the calculated patterns of G. Weise et al [8]. Measurements of the 100 and 110 pole figures showed constant integral intensity which means there is a random orientation of the structural units without any texture.…”
Section: Coatings By Magnetron Sputteringsupporting
confidence: 86%
“…The broadening or drop in the intensity of the (10L) plan is observed with the progressive decrease of the lateral dimensions of the basal plans and the platelets. This situation would arise when the lateral order of the basal plans did not exceed a couple of lattice parameters [3]. It should be pointed out that similar results have been obtained in case of W-S-C films, where the existence of WS 2 nanograins in a carbon matrix was confirmed by HRTEM observation [4].…”
supporting
confidence: 66%
“…With the progressive decrease of the lateral dimensions of the basal plans, either broadening or drop in the intensity of the (10L) plan occurred until a unique low intensity and broad peak typical of an amorphous structure was detected. This situation would arise when the lateral order of the basal plans did not exceed a couple of lattice parameters [13]. It has been shown that similar extended peak shoulder was present in XRD of W-S-C films, where the existence of WS 2 nanograins in a carbon matrix was confirmed by HRTEM observation [8].…”
Section: Morphology and Structurementioning
confidence: 76%
“…Finally a last peak positioned at 2θ ≈ 70°has been indexed as (110). Weise et al [13] demonstrated that the extended shoulder of the sputtered MoSe 2 peak positioned close to 2θ ≈ 40°cor-responded to a turbostrating stacking of (10L) planes (L = 0, 1, 2, 3). XRD patterns then could be explained by a 2D organization of the basal plans which could have several tenths of unit cells dimension.…”
Section: Morphology and Structurementioning
confidence: 99%