2006
DOI: 10.1016/j.matlet.2006.01.090
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Preparation of nanocrystalline zinc carbonate and zinc oxide via solid-state reaction at room temperature

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Cited by 28 publications
(16 citation statements)
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“…Coating with solid-state reaction at room temperature is a novel method with advantages such as high yield, strong selection, low cost, and environmentally friendly. Additionally, there is no need of a solvent, which eliminates the reunion problem [19][20][21]. The differences of the electrochemical properties and thermal behavior …”
Section: Introductionmentioning
confidence: 99%
“…Coating with solid-state reaction at room temperature is a novel method with advantages such as high yield, strong selection, low cost, and environmentally friendly. Additionally, there is no need of a solvent, which eliminates the reunion problem [19][20][21]. The differences of the electrochemical properties and thermal behavior …”
Section: Introductionmentioning
confidence: 99%
“…1(b), the DTA curve shows that thermal decomposition of ZnO precursor below 725°C occurs at an endothermic peak. The endothermic peak at 264.1°C is attributed to thermal decomposition of ZnCO 3 and the formation of crystalline ZnO [18]. …”
Section: Catalytic Ability Of Productsmentioning
confidence: 99%
“…The absorbency of Ce 1−x Zn x O 2−x between 280 and 400 nm changes with x and calcination temperature. Therein, the UV absorbency of samples obtained from calcining ZnCO 3 is markedly influenced by calcining temperature, which is because the sample obtained below 300°C is ZnCO 3 , and the sample obtained above 300°C is ZnO [18]. In order to compare the UV absorbing ability between samples with different compositions quantitatively, the dependence of UV absorbency peak area between 280 and 400 nm for Ce 1−x Zn x O 2−x on calcination temperature is given in Fig.…”
Section: Uv-vis Analysis Of the Precursor And Calcined Samplesmentioning
confidence: 99%
“…According to the Scherrer formula: D = K /(ˇcos Â), where D is particle diameter, K = 0.89 (the Scherrer constant), = 0.15406 (wavelength of the X-ray used),ˇis the width of line at the halfmaximum intensity and  is the corresponding angle [12]. The particle sizes of products are estimated from the strongest three diffraction peaks below 40 • for 2Â.…”
Section: Xrd Analysis Of the Product And Its Calcined Samplesmentioning
confidence: 99%