Preparation of Fe&amp;ndash;Pt&amp;ndash;Si Amorphous Ribbons and Their Coercivity after Crystallization

Yamamoto, Takahiro; Omori, Akihiro; Makino, Akihiro; Inoue, Akihisa

doi:10.2320/matertrans.48.74

Cited by 2 publications

(1 citation statement)

References 13 publications

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“…Some previous researches have shown that the slow weight loss might be caused by the gradual condensation loss of adjacent Si-OH on the silica@FePt film surface [22]. Moreover, at 900°C around, we observe a rapid weight loss, which demonstrates that amorphous silica@FePt have appeared crystallization according to previous researches [23]. The inset in Fig.…”

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confidence: 50%

Terahertz dielectric response of silica-encapsulated FePt core–shell colloid film

Zhou

et al. 2014

Appl. Phys. A

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Time-domain terahertz (THz) spectroscopy is employed to investigate the dielectric response of silicaencapsulated FePt core-shell colloid film in THz region. The absorption of the colloid film increases with the increasing of the frequency, while the refractive index is stable at about 1.85 in the range of 0.85-3.0 THz. The real and imaginary parts of the dielectric constant of the silica@FePt film are demonstrated to be broadband from 0.85-3.0 THz. Small dispersive features can be seen below the frequency of 0.85 THz, which is tentatively attributed to the scattering effect and the polarization relaxation under low frequency with a low dynamic range. A core-shell model combined with Maxwell-Garnett mixing rule has been used to describe the dielectric response of the colloid film, which is necessary for a reasonable explanation of the experimental data as few experiments have been done with the core-shell model employed. In the high-frequency region, the real part of the dielectric constant fits well; however, the imaginary part of the dielectric constant is lower than the experimental data. The difference between the theoretical analysis and the experimental data suggests that the interfacial effect should be paid attention for the core-shell structures as the diffusion of interfacial dipoles could influence the dielectric properties.

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Section: Resultssupporting

confidence: 50%

Terahertz dielectric response of silica-encapsulated FePt core–shell colloid film

Zhou

et al. 2014

Appl. Phys. A

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Remanence enhancement in nanoscaled electrodeposited FePt films

Leistner

Schlörb

Thomas

et al. 2008

Applied Physics Letters

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L 1 0 FePt films with a small grain size of around 13nm have been prepared by electrodeposition and postannealing at a low annealing temperature of 400°C. A high remanence of up to 0.9T is achieved due to remanence enhancement by exchange coupling between the nanosized grains. Coercivity increases with longer annealing time as the L10 order becomes more complete. The resulting maximum energy product reaches a high value of 70kJ∕m3 after annealing for 120min, exceeding the maximum energy products so far obtained in electrodeposited hard magnetic films.

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Preparation of Fe–Pt–Si Amorphous Ribbons and Their Coercivity after Crystallization

Cited by 2 publications

References 13 publications

Terahertz dielectric response of silica-encapsulated FePt core–shell colloid film

Terahertz dielectric response of silica-encapsulated FePt core–shell colloid film

Remanence enhancement in nanoscaled electrodeposited FePt films

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