Preparation of cadmium-containing brown rice grains as calibration standards for X-ray fluorescence analysis of cadmium in rice grains

Inui, Tetsuo; Koike, Yuya; Nakamura, Toshihiro

doi:10.1002/xrs.2524

Cited by 9 publications

(12 citation statements)

References 12 publications

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“…All cereal samples were stored in a silica gel desiccator at room temperature. The calibration standards were prepared in the same way as Cd‐containing rice grain standards …”

Section: Methodsmentioning

confidence: 99%

“…X‐ray fluorescence (XRF) spectrometry is a rapid and convenient method because it can directly analyze solid samples. For this reason, XRF has been used for determining Cd in rice samples . Yada et al .…”

Section: Introductionmentioning

confidence: 99%

“…Inui et al . developed a method of quantitatively adding Cd to white rice grains and brown rice grains according to the target concentration. Furthermore, they showed that Cd in white rice grains (Indica rice, from Thailand) can be determined by XRF using Cd‐containing white rice grains (Japonica rice) and brown rice grains (Japonica rice) prepared by this method as calibration standards.…”

Section: Introductionmentioning

confidence: 99%

“…In this paper, we prepared As‐containing white rice grain standards in the same way as Cd‐containing rice grain standards . This paper deals with (1) trace elements in cereals, (2) As species for the preparation of calibration standards, (3) preparation of As‐containing white rice grains, (4) sample thicknesses, (5) stability for irradiation by X‐rays, (6) homogeneity of the standards, (7) short‐term preservation, (8) calibration curve, and (9) the sample form.…”

Section: Introductionmentioning

confidence: 99%

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Preparation of arsenic‐containing white rice grains as calibration standards for X‐ray fluorescence analysis of total arsenic in cereals

et al. 2016

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A preparation method of arsenic‐containing white rice grains as calibration standards was developed for the X‐ray fluorescence (XRF) analysis of arsenic in rice grains. Calibration standards were prepared by adding 10 g of white rice grains (from Japan) to 100 ml methanol‐containing dimethylarsinic acid corresponding to 2–100 µg arsenic. The mixture was heated, dried at 150 °C, cooled to room temperature, and then stored in a silica gel desiccator. A total of 5.0 g of each calibration standard was packed into a polyethylene cup (32 mm internal diameter and 23 mm height) covered with a 6‐µm‐thick polypropylene film and then analyzed by wavelength‐dispersive XRF spectrometry. The calibration curve for arsenic obtained from the white rice grains containing arsenic showed good linearity over a concentration range of 0.21–5.00 mg kg−1 arsenic. The limit of detection of arsenic was 0.080 mg kg−1. To check the reliability of the XRF method, the concentrations of arsenic in six samples of grain cereals and two samples of flour were compared with those obtained by atomic absorption spectrometry after acid decomposition. The values obtained by both analytical methods showed good agreement. Copyright © 2016 John Wiley & Sons, Ltd.

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“…All cereal samples were stored in a silica gel desiccator at room temperature. The calibration standards were prepared in the same way as Cd‐containing rice grain standards …”

Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Preparation of arsenic‐containing white rice grains as calibration standards for X‐ray fluorescence analysis of total arsenic in cereals

et al. 2016

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“…In another study, Inui et al . packed loose powders of rice grains without pulverization and homogenization and analyzed their cadmium contents using Cd Kα radiation . The analytical depth of Cd Kα (6.5 cm) was estimated as four times the half‐thickness.…”

Section: Thicknessmentioning

confidence: 99%

Approaches to solid sample preparation based on analytical depth for reliable X‐ray fluorescence analysis

Ichikawa

Nakamura

2016

X-Ray Spectrometry

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In this paper, we discuss approaches to prepare solid samples for X-ray fluorescence spectrometry (XRF). Although XRF can be used to analyze major and minor elements in various solid samples including powders and grains without dissolution techniques, to obtain reliable XRF results, the prepared sample must meet certain criteria related to homogeneity, particle size, flatness, and thickness. The conditions are defined by the analytical depth of fluorescent X-rays from analytes, and the analytical depth can be estimated from the X-ray absorption related to the energy of each X-ray and the composition and density of the sample. For example, when the sample flatness and particle size are less than the analytical depth and the sample possesses homogeneity within a depth less than the analytical depth, the XRF results are representative of the entire sample. Furthermore, an appropriate sample thickness that is larger than the analytical depth or constant can prevent changes in fluorescent X-ray intensity with variations in sample thickness. To obtain accurate and reproducible measurements, inhomogeneous solid samples must be pulverized, homogenized, and prepared as loose powder, powder pellets, or glass beads. This paper explains the approaches used to prepare solid samples for XRF analysis based on the analytical depths of fluorescent X-rays.

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Solid Sample Preparations and Applications forX‐Ray Fluorescence Analysis

Ichikawa

Nakamura

2016

Encyclopedia of Analytical Chemistry

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X‐ray fluorescence spectrometry (XRF) has been routinely employed for simple and convenient determination of major and minor elements in solid and powder samples without dissolution treatment. In addition, spectrometers have been downsized and automated with the development of instrumental components and analytical techniques. Modern XRF instruments are used by not only analysts but also persons in various fields with little analytical knowledge and technique and who may not verify the reliability of the analytical results and/or sample preparation. However, the accuracy of XRF determination largely depends on the sample conditions such as flatness, particle size, homogeneity, and thickness. Appropriate conditions are identified by the analytical depth of fluorescent X‐rays. This article details solid and powder sample preparations based on the analytical depth and type of XRF specimen (loose powder, powder pellets, or glass beads). Moreover, it describes calibration curves using synthetic standards prepared by chemical reagents containing analytes. These standards are validated against reference materials (RMs) for reliable XRF determination.

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Preparation of cadmium-containing brown rice grains as calibration standards for X-ray fluorescence analysis of cadmium in rice grains

Cited by 9 publications

References 12 publications

Preparation of arsenic‐containing white rice grains as calibration standards for X‐ray fluorescence analysis of total arsenic in cereals

Preparation of arsenic‐containing white rice grains as calibration standards for X‐ray fluorescence analysis of total arsenic in cereals

Approaches to solid sample preparation based on analytical depth for reliable X‐ray fluorescence analysis

Solid Sample Preparations and Applications forX‐Ray Fluorescence Analysis

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