2015
DOI: 10.1007/s10853-015-9648-y
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Preparation of (001) preferentially oriented titanium thin films by ion-beam sputtering deposition on thermal silicon dioxide

Abstract: We propose the ion-beam sputtering deposition providing Ti thin films of desired crystallographic orientation and smooth surface morphology not obtainable with conventional deposition techniques such as magnetron sputtering and vacuum evaporation. The sputtering was provided by argon broad ion beams generated by a Kaufman ion-beam source. In order to achieve the optimal properties of thin film, we investigated the Ti thin films deposited on an amorphous thermal silicon dioxide using X-ray diffraction, and atom… Show more

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Cited by 18 publications
(3 citation statements)
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“…The deposition of PZT thin films can be achieved by both physical and chemical coating techniques [52]. The physical approaches include ion beam sputtering [53], radiofrequency planer magnetron sputtering [54], and DC magnetron sputtering [55]. Chemical techniques such as metal-organic chemical vapor deposition (MOCVD) [56], chemical solution deposition [57], and metal-organic decomposition [58] have also been applied for depositing PZT thin films.…”
Section: Lead-based Piezoelectric Thin Filmsmentioning
confidence: 99%
“…The deposition of PZT thin films can be achieved by both physical and chemical coating techniques [52]. The physical approaches include ion beam sputtering [53], radiofrequency planer magnetron sputtering [54], and DC magnetron sputtering [55]. Chemical techniques such as metal-organic chemical vapor deposition (MOCVD) [56], chemical solution deposition [57], and metal-organic decomposition [58] have also been applied for depositing PZT thin films.…”
Section: Lead-based Piezoelectric Thin Filmsmentioning
confidence: 99%
“…The wafers were loaded into the IBAD instrument and the system was evacuated to a base pressure of ≈9 × 10 −7 Pa. Wafers were then pre-cleaned using a secondary ion-beam source with Ar plasma with 30 V beam voltage (BV), for a duration of 300 s. We then deposited ≈80 nm of Ti, serving as a seed layer for consequent AlN (001) deposition, as well as an electrical connection between the AlN and Si substrate. We activated the primary Kaufman ion-beam source, using a BV of 200 V, resulting in a (001) oriented layer of Ti [18,19]. This was followed with a change in the BV to 400 V and the addition of N 2 to the primary ion-beam source, with a ratio of 1:1 to Ar.…”
Section: Chip Design and Fabricationmentioning
confidence: 99%
“…Both layers were sputtered by ion-beam deposition system (Bestec) equipped with RFICP Kaufman ion-beam source (Kaufman & Robinson -KRI ). The deposition parameters (thickness and rate of deposition) were monitored by Inficon SQM-242 card with a quartz crystal sensor as reported previously [11]. The lithography process was carried out using UV direct write laser system (Heidelberg Instruments, DWL 66-fs), and the process conditions of development steps were set according to the specifications provided by the producer of the photoresist (Allresist, AR-N 4340).…”
Section: Microelectrode Systemmentioning
confidence: 99%