2010
DOI: 10.1016/j.micromeso.2010.02.001
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Preparation and microstructural characterization of oriented titanosilicate ETS-10 thin films on indium tin oxide surfaces

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Cited by 9 publications
(10 citation statements)
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“…For instance, CPO values for ETS-10 membranes prepared on a-alumina substrates and ITO coated glass substrates were calculated [3,5]. Yilmaz et al compared the peak intensities of (110) and (001) planes instead of calculating CPO.…”
Section: Resultsmentioning
confidence: 99%
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“…For instance, CPO values for ETS-10 membranes prepared on a-alumina substrates and ITO coated glass substrates were calculated [3,5]. Yilmaz et al compared the peak intensities of (110) and (001) planes instead of calculating CPO.…”
Section: Resultsmentioning
confidence: 99%
“…The diffraction peaks were scanned between 5°a nd 40°with a scan speed of 1°/min for phase identification. The degree of out-of-plane preferred orientation of AM-6 films was quantified by comparing the integrated intensities of (105) and (200) where, I depicts the integrated intensity of the corresponding reflections, the subscripts p and f represent powder sample (randomly oriented) and films (preferentially oriented), respectively [3,5]. The integrated intensity of XRD peaks was determined using the Rigaku-Ultima IV XRD software.…”
Section: Characterizationmentioning
confidence: 99%
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“…Through hydrothermal pretreatment of the precursor solution, c-oriented growth of the seed layer became predominant in secondary growth [22]. An a-oriented ETS-10 film with columnar grain boundary microstructures was recently grown on an ITO glass substrate by secondary growth of a preferentially a-oriented ETS-10 seed multilayer [23]. We recently synthesized highly a-and b-oriented zeolite T membranes by microwave-assisted secondary growth of preferentially oriented seed layers.…”
Section: Introductionmentioning
confidence: 99%