1973
DOI: 10.1016/0025-5408(73)90016-0
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Preparation and investigation of LaB6 films

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Cited by 12 publications
(9 citation statements)
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“…The application of triode sputtering (30,32,40), dc (4,5,22,33,38,(44)(45)(46)(47)(48)(49)(50)(51)(52)(53)(54)(55)(56)(57)(58)(59)(60)(61) and rf magnetron sputtering (31,(34)(35)(36)(37)(38)(39)(40)(41)(42)(43), electron-beam evaporation (20)(21)(22)(23)(24)(25)(26)(27), and arc evaporation (28,29) for the deposition of boride coatings is reported in the literature. Because of the low electrical and thermal conductivity of boron (22) and because of the high reactivity of certain rare-earth metals with oxygen (e.g., lanthanum and cerium), most PVD processes make use of the corresponding boride as the vapor source in...…”
Section: Pvd Methods For the Deposition Of Boride Coatingsmentioning
confidence: 99%
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“…The application of triode sputtering (30,32,40), dc (4,5,22,33,38,(44)(45)(46)(47)(48)(49)(50)(51)(52)(53)(54)(55)(56)(57)(58)(59)(60)(61) and rf magnetron sputtering (31,(34)(35)(36)(37)(38)(39)(40)(41)(42)(43), electron-beam evaporation (20)(21)(22)(23)(24)(25)(26)(27), and arc evaporation (28,29) for the deposition of boride coatings is reported in the literature. Because of the low electrical and thermal conductivity of boron (22) and because of the high reactivity of certain rare-earth metals with oxygen (e.g., lanthanum and cerium), most PVD processes make use of the corresponding boride as the vapor source in...…”
Section: Pvd Methods For the Deposition Of Boride Coatingsmentioning
confidence: 99%
“…1a and 1c). Typical grain sizes for this structure type revealed from X-ray diffraction (XRD) measurements on ZrB -and LaB -based films were found to be below 40 nm for electron-beam evaporation (21) and below 20 nm (21,30,48) for sputtering. In the complementary growth region, i.e., extremely low or high energetic contribution (e.g., high argon pressure, low substrate temperature or high bias voltage, respectively) and due to the addition of nitrogen using reactive PVD processes, the structure of the coatings becomes extremely fine-grained to amorphous (see Figs.…”
Section: Relationships Between Deposition Conditions and Microstructurementioning
confidence: 98%
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“…From resistivity, Hall coefficient , concentration, and mobility measurements, Winsztal et al [376] have shown the metallic nature of conduction in LaB, layers. Compared to the bulk, thin films had a n equivalent carrier concentration, higher resistivity, and lower Hall mobility.…”
Section: Physical Propertiesmentioning
confidence: 99%