Preparation and Characterization of Porous Polymethylmethacrylate Film Showing Optical Reflectivity

Abstract

This paper describes a method for the preparation of porous polymethylmethacrylate showing optical reflectivity from the porous silicon template. A porous polymethylmethacrylate showing optical reflectivity was prepared by replicating porous silicon template which was obtained by applying a computer-generated periodic square current density and resulted in a mirror with high reflectivity in a specific narrow spectral region. A porous polymethylmethacrylate showing an excellent reflectivity was successfully obtained by dissolving the Porous silicon template from the porous polymethylmethacrylate composite film. A porous polymethylmethacrylate exhibited a sharp reflection resonance in the reflectivity spectrum. Surface image of the porous polymethylmethacrylate indicated that the surface of the porous polymethylmethacrylate film had a porous structure. These porous polymethylmethacrylate films in aqueous solutions were stable for several days without any degradation.

Chemical Sensors Based on Distributed Bragg Reflector Porous Silicon Smart Particles

“…For sensing applications, it is desired to provide a sharp reflection band at a desired wavelength in the optical reflectivity spectrum. The multi-structured PSi such as distributed Bragg reflector (DBR) PSi [18][19][20][21][22] or rugate PSi [23,24] exhibits unique optical properties providing a sharp reflection band at specific wavelength in the optical reflectivity spectrum. DBR PSi as multi-layered PSi has been typically prepared by an applying a square current waveform to the etch cell.…”

Fabrication and Characterization of Optically Encoded Porous Silicon Smart Particles

“…To provide a reflection band at a desired wavelength in the optical reflectivity spectrum, the multi-structured PSi such as distributed Bragg reflector (DBR) PSi [18][19][20][21][22] or rugate PSi [23,24] exhibits unique optical properties providing a reflection band at specific wavelength in the optical reflectivity spectrum. The direction of pores and pore diameters depend on surface orientation, doping level and type, temperature, the current density, and the composition of the etching solution.…”