International Conference on Advanced Nanomaterials &Amp; Emerging Engineering Technologies 2013
DOI: 10.1109/icanmeet.2013.6609226
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Preparation and characterization of nano structured SnS<inf>2</inf> by solid state reaction method

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Cited by 6 publications
(4 citation statements)
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“…The blue-shift is due to confinement effects in SnS 2 nanoparticles 22 and the red-shift may stem from deep level emission from a stoichiometric variation in nanostructured SnS 2 . [21][22][23]56 One calculated bandgap for single crystal SnS 2 using HSE06 techniques is 2.24 eV, 57 close to our experimental value. Our observed PL peaks as well as existing reports imply that SnS 2 flakes with more than one monolayer possess a direct bandgap.…”
Section: Crystal Growth and Designsupporting
confidence: 85%
See 1 more Smart Citation
“…The blue-shift is due to confinement effects in SnS 2 nanoparticles 22 and the red-shift may stem from deep level emission from a stoichiometric variation in nanostructured SnS 2 . [21][22][23]56 One calculated bandgap for single crystal SnS 2 using HSE06 techniques is 2.24 eV, 57 close to our experimental value. Our observed PL peaks as well as existing reports imply that SnS 2 flakes with more than one monolayer possess a direct bandgap.…”
Section: Crystal Growth and Designsupporting
confidence: 85%
“…Various methods from simple to elaborate have been used to grow SnS 2 single crystals, nanostructures, and films. Examples include mechanical and chemical exfoliations, chemical vapor transport using iodine as the transport agent, , chemical vapor deposition (CVD) using SnO 2 , atmospheric vapor pressure deposition using SnS 2 , hydrothermal, ,, wet chemistry, solid state reaction, , atomic layer deposition, solvothermal method, and hot-injection method . In this work we present a one-step method with a short turn-around time to grow single crystalline ultrathin (a few nanometers) to thin SnS 2 (hundreds of nanometers) flakes with diameters of over tens of microns on amorphous SiO 2 substrates: coevaporation of Sn at 600 °C and S at 150 °C under Ar flow on SiO 2 substrates held at 600 °C.…”
Section: Introductionmentioning
confidence: 99%
“…Moreover, the tiny peaks around 37.6 and 41.9° are detected and are assigned to Cu 3 Sn phase . The peaks assigned to phases of Cu 2 S, SnS 2 , and SnS appear as the temperature increases to 300 °C, indicating the occurrence of reactions between Cu, Sn, and S atoms at this temperature . It is noted that the intensity of peaks originated from Cu 3 Sn phase enhances accompanied with the disappearance of peaks from Cu 6 Sn 5 , which suggests the existence of reaction (1) as shown below: 2Cu6Sn5+19S3Cu2S+8SnS2+2Cu3Sn, 2Cu3Sn+7S3Cu2S+2SnS2, Cu2S+SnS2Cu2SnS3. …”
Section: Resultsmentioning
confidence: 92%
“…We observed only one PL peak at 542 nm (2.28 eV) for the SnS 2 film. Measured PL peaks reported in the literature vary widely from no significant peak, single peak around 625 nm (1.90 eV), two peaks at 526 (2.35 eV) and 819 nm (1.51 eV), two peaks at 620 (2.29 eV) and 700 nm (1.87 eV) for a single crystal, and 551 nm (2.2 eV) from multilayered SnS 2 . These wide variations may be caused by film orientation, mixed phases, crystalline quality, thickness, confinement, defects, and impurities.…”
Section: Results and Discussionmentioning
confidence: 99%