2020
DOI: 10.1016/j.ijleo.2020.164935
|View full text |Cite
|
Sign up to set email alerts
|

Preparation and characterization of layer-diffusion processed InBi2Se4 thin films for photovoltaics application

Abstract: S. (2020) Preparation and characterization of layer-diffusion processed InBi2Se4 thin films for photovoltaics application. Optik, 220. p. 164935.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
6
1

Relationship

1
6

Authors

Journals

citations
Cited by 7 publications
(3 citation statements)
references
References 22 publications
0
3
0
Order By: Relevance
“…The crystallite size (D) can be calculated for the 350 C annealed SnSe thin film (102) by using the full width at half maximum (FWHM) β in Debye Scherrer formula given by 20 as shown below:…”
Section: Resultsmentioning
confidence: 99%
“…The crystallite size (D) can be calculated for the 350 C annealed SnSe thin film (102) by using the full width at half maximum (FWHM) β in Debye Scherrer formula given by 20 as shown below:…”
Section: Resultsmentioning
confidence: 99%
“…By plotting αhν on the y-axis and hν on the x-axis and using the given relation as in reference [26,27] we get the value of the band gap. Here α represent the absorption coefficient and h is the planks constant and E g is the band gap energy.…”
Section: Fig 2 Xrd Analysis Annealed At Temperature 250⁰cmentioning
confidence: 99%
“…The indexed composition possesses tetragonal structure along with space group 14/mmm and it contains RP structure as listed in table 1 [11]. The average crystalline size of every sample is calculated using the Debye Scherrer equation and the reflection of the 2θ value of the XRD data [11][12][13],…”
Section: Structural and Microstructural Analysesmentioning
confidence: 99%