Preliminary study of electron‐energy‐loss spectra of YBa2 Cu3O7−δ

Batson, Philip E.; Chisholm, M. F.

doi:10.1002/jemt.1060080310

Cited by 9 publications

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References 8 publications

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“…The use of a parallel EELS spectrometer in the TEM allows to obtain spectra containing the oxygen K-edge within one to several minutes (< 5 min) of acquisition time. The electron dose for EEL spectra acquisition in the TEM with the PEELS spectrometer is significantly l " ' l " ' I "~1 " ' [3] 9* lower than with a serial spectrometer attached to a dedicated field emission STEM [6]. EEL spectra obtained for YBa,Cu,O,-, in [5] showed slight changes before and after irradiation.…”

Section: Eels Experimentsmentioning

confidence: 99%

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EELS of YBa2Cu3O7−x in the TEM. A High Spatial Resolution Method for Analysing the Electronic Structure of High-Tc YBa2Cu3O7−x Thin Films

Eibl¹,

Aken

Müller

1991

Phys. Stat. Sol. (a)

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A series of YBa,Cu,O,-, thin films was deposited on (100) SrTiO, substrates in order to study the electrical properties of the films for different oxygen contents of the material. Combined electron diffraction and electron energy loss analyses yield information on the crystal and the electronic structure of YBa,Cu,O,-, with high lateral resolution. With these techniques it is possible to distinguish superconducting from nonsuperconducting areas with a resolution of 10 to 50 nm. Since big progress is achieved for application of YBa,Cu,07 -, in thin film technology these techniques will be extremely useful for analysing devices based on YBa,Cu,O,. Eine Serie von dunnen YBa,Cu,O, -.-Filmen wird auf (lOO)-orientierten SrTi0,-Substraten abgeschieden, um die elektrischen Eigenschaften der Filme fur verschiedenen Sauerstoffgehalt des Materials zu untersuchen. Elektronenbeugung und Elektronen-Energieverlustspektroskopie ermoglichen Aussagen iiber die Kristallstruktur und die elektronische Struktur von YBa,Cu,O, -, mit hoher Ortsauflosung. Mit diesen Methoden ist es moglich, supraleitende Bereiche von nicht supraleitenden Bereichen mit einer Auflosung von 10 bis 50 nm zu unterscheiden. GroIje Fortschritte werden bei der technologischen Anwendung von dunnen YBa,Cu,O, -,-Filmen erzielt, und diese Methoden werden fur die Analyse solcher Filme von grol3er Bedeutung sein.

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Section: Eels Experimentsmentioning

confidence: 99%

“…The first contribution in(6) yields 2n q; IMll12 and the second 2 j I(fl q1 . Y li)12 d q =: 2nqf IK12, which is an average of the matrix element in the a, b plane.…”

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confidence: 99%