Preferential removal of organic material from acid-etched human dental enamel by an ion-etching method

A scanning electron microscope study of the three‐dimensional extent of Retzius lines in human dental enamel

“…In ground seetions of enamel this topography is determined by the action of the acid on the tissue. For a given acid this action is mainly determined by two factors -a) orientation of crystals relative to the plane of section (19) and b) distribution of organic material (20)(21). Although many fme details are diselosed in this way it is not unlikely that the interaction of light with enamel is even more sensitive to variations in enamel strueture and/or composition.…”

Factors affecting the ion‐beam thinning characteristics of ceramics

“…A general description of this application has been given by Barber (1970). Also, Dhariwal et al (1977Dhariwal et al ( ,1978 and Hoshino (1978) have considered the use of ion beams for scanning electron microscopy sample preparation. However, despite these and many other reports of ion sputtering very little quantitative data exists relating to the factors controlling the preparation of good microscope specimens, the usual objective being to produce a thin damage free specimen of uniform thickness in the shortest practicable time.…”

Multiangular viewing of dental enamel in the SEM: an apparatus for controlled mechanical specimen preparation

“…The disadvantage of this method is that the resulting etched surface is an artificial one, a fact which should always be remembered during interpretation. However, we now know a great deal about the relationship between the etching pattern and the enamel mierostructure (4)(5)(6)(7)(8).…”