2016
DOI: 10.1016/j.desal.2015.12.012
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Prediction of single salt rejection in nanofiltration membranes by independent measurements

Abstract: In this work a method is proposed to predict salt rejection by nanofiltration. The procedure starts from the steric, electric and dielectric exclusion model with charge (and permitivity) depending on the concentration along the pore, SEDE-VCh, for membrane characterization, and substitutes all fitting parameters by values obtained by independent methods. These parameters are the relative permittivity inside the pores and the two constants of the Freundlich isotherm for the volumetric charge density, which can … Show more

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Cited by 22 publications
(18 citation statements)
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“…A Nanoscope Multimode IIIa scanning probe microscope from Digital Instruments (Veeco Metrology Inc., USA) was used, following the method described elsewhere [19]. The calculated values of surface roughness were averaged over 5 different profiles for each membrane sample using a scanning area of 1×1 μm 2 .…”
Section: Atomic Force Microscopy (Afm)mentioning
confidence: 99%
“…A Nanoscope Multimode IIIa scanning probe microscope from Digital Instruments (Veeco Metrology Inc., USA) was used, following the method described elsewhere [19]. The calculated values of surface roughness were averaged over 5 different profiles for each membrane sample using a scanning area of 1×1 μm 2 .…”
Section: Atomic Force Microscopy (Afm)mentioning
confidence: 99%
“…The dominance of the shielding phenomenon is found for all types of membranes for all salt concentrations and types. This phenomenon has been previously investigated in the literature by many researchers (Labban, Liu, Chong, Lienhard, & J. H., 2017; Nicolini, Borges, & Ferraz, 2016; Silva et al, 2016). According to the shielding effect, for any charged membrane surface when it meets counterions, these ions then diminish or reduce the membrane surface charge.…”
Section: Resultsmentioning
confidence: 78%
“…AFM images were obtained using a Nanoscope Multimode IIIa ® from Digital Instruments (Veeco Metrology Inc., Santa Barbara, CA, USA) in the tapping mode, in accordance with the methods described elsewhere [25]. Roughness and power spectral density (PSD) were analyzed using the NanoScope Software Version 5.30 (Veeco Metrology Inc., Santa Barbara, CA, USA).…”
Section: Methodsmentioning
confidence: 99%