2010
DOI: 10.1051/ijmqe/2010017
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Precision grating for measuring microscope lens distortions

L. Jiang

Abstract: Abstract. Microscopy is used in most technology processes where two-dimensional distributions, that are digital images of the shape and appearance of integrated circuit (IC) features, reveal important information. Optical microscopy and diffraction gratings can be used to measure the placement of IC features with a precision of less than 1 nm (1σ) with a new technique of separately viewing multiple levels. However, the microscope's optical and video camera distortion may cause significant errors in the IC feat… Show more

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Cited by 2 publications
(4 citation statements)
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“…k is a vector parameter of distortion, and r l is the distance between u and u l . The order of the distortion function is often determined by the length of k. Most authors agreed that for barrel-radial distortions, second or forth order d is sufficient [1], [6], [8]. The proposal for pincushion distortions therefore is:…”
Section: Modelling the Pincushion Distortionsmentioning
confidence: 99%
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“…k is a vector parameter of distortion, and r l is the distance between u and u l . The order of the distortion function is often determined by the length of k. Most authors agreed that for barrel-radial distortions, second or forth order d is sufficient [1], [6], [8]. The proposal for pincushion distortions therefore is:…”
Section: Modelling the Pincushion Distortionsmentioning
confidence: 99%
“…The maximum likelihood estimate was obtained by minimizing a nonlinear minimization problem, which was solved with the LevenbergMarquardt Algorithm. The algorithm is well described and implemented by [1], [6], [12], [14].…”
Section: The Camera Modelmentioning
confidence: 99%
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