Precise topological transition and negative refraction of a wave vector in a symmetrically arranged Al₂O₃/Ag/Al₂O₃ multilayer

Abstract

The topological transition of a symmetrically arranged Al2O3/Ag/Al2O3 multilayer is precisely estimated by the product of characteristic film matrixes instead of treating the multilayer as an anisotropic medium with effective medium approximation. The variation of the iso-frequency curve among a type I hyperbolic metamaterial, a type II hyperbolic metamaterial, a dielectric-like medium, and a metal-like medium of such a multilayer with wavelength and the filling fraction of the metal is investigated. The estimated negative refraction of wave vector in a type II hyperbolic metamaterial is demonstrated with near field simulation.