Preamplifying cantilevers for dynamic atomic force microscopy

Zeyen, B.; Virwani, Kumar; Pittenger, Bede; Turner, Kimberly L.

doi:10.1063/1.3093814

Cited by 14 publications

(9 citation statements)

References 9 publications

(8 reference statements)

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“…The simultaneously measured resonant frequency and quality factor are a measure of the elastic properties of the surface and surface topography and are not studied further (note that the resonance frequencies can change by as much as 50 kHz across the surface, as compared to ca. 3−5 kHz resonance peak width, thus necessitating the use of BE or similar non phase locked loop based methods − ). The measured ESM signal scales linearly with V ac in the 1 − 6 V ac range at 400 kHz, suggesting a linear relationship between the driving force (the applied voltage) and the Li concentration.…”

Section: Resultsmentioning

confidence: 99%

Decoupling Electrochemical Reaction and Diffusion Processes in Ionically-Conductive Solids on the Nanometer Scale

Balke

Jesse

Kim³

et al. 2010

ACS Nano

100

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We have developed a scanning probe microscopy approach to explore voltage-controlled ion dynamics in ionically conductive solids and decouple transport and local electrochemical reactivity on the nanometer scale. Electrochemical strain microscopy allows detection of bias-induced ionic motion through the dynamic (0.1-1 MHz) local strain. Spectroscopic modes based on low-frequency (∼1 Hz) voltage sweeps allow local ion dynamics to be probed locally. The bias dependence of the hysteretic strain response accessed through first-order reversal curve (FORC) measurements demonstrates that the process is activated at a certain critical voltage and is linear above this voltage everywhere on the surface. This suggests that FORC spectroscopic ESM data separates local electrochemical reaction and transport processes. The relevant parameters such as critical voltage and effective mobility can be extracted for each location and correlated with the microstructure. The evolution of these behaviors with the charging of the amorphous Si anode in a thin-film Li-ion battery is explored. A broad applicability of this method to other ionically conductive systems is predicted.

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Section: Resultsmentioning

confidence: 99%

Decoupling Electrochemical Reaction and Diffusion Processes in Ionically-Conductive Solids on the Nanometer Scale

Balke

Jesse

Kim³

et al. 2010

ACS Nano

100

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“…In fact, in our previous works, , we have verified the use of a similar two-DOF lumped parameter ROM for predicting the dynamical behavior of an inner-paddled cantilever system in tapping mode (or AC mode) AFM. Other previous works employing similar inner-paddles − have shown that, when the dimensional parameters are of the same order, the entire inner-paddled microcantilever behaves like a unitary structure, in which case the above modeling approach would fail. A detailed discussion of the effect of dimensional parameters on the dynamics of the system can be found in the Supporting Information.…”

Section: Resultsmentioning

confidence: 98%

Ultimate Decoupling between Surface Topography and Material Functionality in Atomic Force Microscopy Using an Inner-Paddled Cantilever

et al. 2018

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Atomic force microscopy (AFM) has been widely utilized to gain insight into various material and structural functionalities on the nanometer scale, leading to numerous discoveries and technologies. Despite the phenomenal success in applying AFM to the simultaneous characterization of topological and functional properties of materials, it has continuously suffered from the crosstalk between the observables, causing undesirable artifacts and complicated interpretations. Here, we introduce a two-field AFM probe, namely an inner-paddled cantilever integrating two discrete pathways such that they respond independently to the variations in surface topography and material functionality. Hence, the proposed design allows reliable and potentially quantitative determination of functional properties. In this paper, the efficacy of the proposed design has been demonstrated via piezoresponse force microscopy of periodically poled lithium niobate and collagen, although it can also be applied to other AFM methods such as AFM-based infrared spectroscopy and electrochemical strain microscopy.

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“…At the same time, the potential for future advances is extraordinarily large. The use of resonance enhancement in PFM though the band excitation [42] and dual-frequency [43] resonance tracking (once data analysis and interpretation problems are resolved) and compound cantilevers [44] will allow measurements of weakly piezoelectric materials, as well as a $10-100-fold increase in energy resolution, signal-to-noise ratio, and reduction in image acquisition times in SS-PFM.…”

Section: Techniquesmentioning

confidence: 99%

Defect‐Mediated Polarization Switching in Ferroelectrics and Related Materials: From Mesoscopic Mechanisms to Atomistic Control

et al. 2010

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The plethora of lattice and electronic behaviors in ferroelectric and multiferroic materials and heterostructures opens vistas into novel physical phenomena including magnetoelectric coupling and ferroelectric tunneling. The development of new classes of electronic, energy‐storage, and information‐technology devices depends critically on understanding and controlling field‐induced polarization switching. Polarization reversal is controlled by defects that determine activation energy, critical switching bias, and the selection between thermodynamically equivalent polarization states in multiaxial ferroelectrics. Understanding and controlling defect functionality in ferroelectric materials is as critical to the future of oxide electronics and solid‐state electrochemistry as defects in semiconductors are for semiconductor electronics. Here, recent advances in understanding the defect‐mediated switching mechanisms, enabled by recent advances in electron and scanning probe microscopy, are discussed. The synergy between local probes and structural methods offers a pathway to decipher deterministic polarization switching mechanisms on the level of a single atomically defined defect.

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Preamplifying cantilevers for dynamic atomic force microscopy

Cited by 14 publications

References 9 publications

Decoupling Electrochemical Reaction and Diffusion Processes in Ionically-Conductive Solids on the Nanometer Scale

Decoupling Electrochemical Reaction and Diffusion Processes in Ionically-Conductive Solids on the Nanometer Scale

Ultimate Decoupling between Surface Topography and Material Functionality in Atomic Force Microscopy Using an Inner-Paddled Cantilever

Defect‐Mediated Polarization Switching in Ferroelectrics and Related Materials: From Mesoscopic Mechanisms to Atomistic Control

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