“…There has been much research work [26, 27] going on over SDP over the past three decades. Naive Bayes [28–31], support vector machine (SVM) [32–34], classification and regression trees [35, 36], AdaBoost [37–39], random forest [40–42], artificial neural network as defect prediction [43, 44], and development effort estimation [45]. Multilayer perceptrons (MLPs) [46, 47] are the most widely used classifiers in defect prediction.…”