Power inside — Applications and technologies for integrated power in microelectronics

Mathúna, Cian Ó; Kulkarni, Santosh; Pavlovic, Zoran; Casey, Declan P.; Rohan, James F.; Kelleher, Ann; Maxwell, G.; O'Brien, J.; McCloskey, Paul

doi:10.1109/iedm.2017.8268318

Cited by 3 publications

(12 citation statements)

References 6 publications

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“…For the characterization of the complex impedance of the inductor using an oscilloscope, it is required to measure two signals: inductor current I L and inductor voltage V L . The inductor impedance can then be calculated using (2).…”

Section: Measurement Setupsmentioning

confidence: 99%

“…There has been a significant number of reports on large signal characterization of discrete passive devices. In the particular case of characterization of inductors, there is an increasing interest because of the thin film components working in Power Supply on Chip or Power Supply in Package [1][2][3][4][5][6][7][8]. These kinds of applications present two main challenges regarding the measurement: (1) the high frequency (above 10 MHz) and (2) the high Q of the component (very small resistance compared to its reactance).…”

Section: Introductionmentioning

confidence: 99%

“…One of the most common approaches to ascertain the validity of a measurement method is by analyzing the error, the uncertainty, or other statistical measure of the deviations of the obtained results [15][16][17][18][19][20][21][22]. Many of the mentioned published measurements fail to provide a proper quantification of this deviation [1][2][3]9]. Others only deal with the uncertainty due to the phase error [13,14,23], neglecting the magnitude error, which may be important, for instance, when measuring near resonance.…”

Section: Introductionmentioning

confidence: 99%

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Comparison of Different Large Signal Measurement Setups for High Frequency Inductors

et al. 2021

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The growing interest of miniaturized power converters has pushed the development of high frequency inductors integrated in Power Supply on Chip or Power Supply in Package. The proper characterization of inductor impedance is a challenge due to the dependence of the impedance on the current, the high quality factor (Q) and the high frequency range where these devices operate. In this paper, we present a comparison of different measuring methods to characterize high frequency and high Q inductors. The comparison is based on a systematic analysis of the measurement process, quantifying the influence of the parameters that affect the measurement result. Four common measurement setups are analyzed and compared. To validate the calculations, the resistance of a high frequency, high-Q inductor is characterized using every presented setup. The good match between calculations, simulation and measurement validates the analysis and the conclusions extracted.

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Section: Measurement Setupsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Comparison of Different Large Signal Measurement Setups for High Frequency Inductors

et al. 2021

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“…Dichas tecnologías permiten generar dispositivos con espesores de núcleo del orden de las décimas de micrómetro, con procesos de fabricación ya desarrollados y establecidos, utilizados en Sistemas microelectromecánicos MEMS, tales como la micro-deposición de materiales laminados o la pulverización de gránulos de material magnético [22]. Esta capacidad para producir materiales con espesores tan reducidos ha permitido emplear núcleos magnéticos en dispositivos de menos de unos milímetros cuadrados, donde hasta ahora los inductores de núcleo de aire eran la única alternativa y los valores de inductancia estaban muy limitados [23].…”

Section: Microinductoresunclassified

“…Algunas de las aplicaciones más prometedoras de los microinductores se corresponden con dispositivos capaces de funcionar a muy alta frecuencia (en torno a 100 MHz) y con valores de inductancia relativamente altos (>10 nH) [10,13,22,24,25,[45][46][47]. La decisión sobre la geometría, el proceso de fabricación y el material debe tomarse, por tanto, en torno a los dos parámetros mencionados.…”

Section: Elección De Diseñounclassified

Integrated inductor optimization for Power Supply on Chip

Lopez

Fernández

Zumel

et al. 2018

2018 IEEE 19th Workshop on Control and Modeling for Power Electronics (COMPEL)

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A todos mis compañeros, por haber hecho no sólo soportable, sino disfrutable, el camino. A los compañeros del máster, especialmente a Carlos, por convertir Madrid en el punto de unión entre dos tierras castellanas. A los compañeros del despacho, tanto a los que ya no están entre nosotros como a los que, por desgracia, aún no han podido irse. A los compañeros del grupo de óptica, que creen que pW significa poderosísimos vatios.A mis colegas irlandeses, en especial a Ruaidhrí, que añadieron a mi dificultad para memorizar nombres la dificultad para escribirlos.A los técnicos del departamento. Especialmente a little Jesus, por enseñarme a soldar, y a big Jesus, por enseñarme a resoldar.A mis tutores. A Pablo por haber iniciado esto y a Cristina por haberlo terminado.A mis padres, que creyeron que estaba eligiendo una vida monacal y tuvieron que lidiar con la apostasía.A Alba, por haber encontrado a un ingeniero tan guapo, tan alto, tan inteligente y tan divertido, y aún así haberse quedado conmigo. Sigues siendo la mejor parte de mí, que soy tu peor parte.

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Comprehensive Design Procedure for Racetrack Microinductors

López-Tenorio

Zumel

O’Driscoll³

et al. 2021

IEEE J. Emerg. Sel. Topics Power Electron.

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Present needs in efficiency and integration are driving research towards the miniaturization of power converters. Among the latest components to achieve the desired degree of integration are cored micro-inductors and they are still one of the hardest devices to optimize, due to the high number of freedom degrees in their fabrication. In this paper, a comprehensive design procedure for these micro-inductors is presented. The proposed method makes it possible to design the optimal device in a single iteration. It also allows the designer to easily ascertain the limits of the inductor in terms of handled current and losses and provides valuable physical insight on the output of the process.

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Power inside — Applications and technologies for integrated power in microelectronics

Cited by 3 publications

References 6 publications

Comparison of Different Large Signal Measurement Setups for High Frequency Inductors

Comparison of Different Large Signal Measurement Setups for High Frequency Inductors

Integrated inductor optimization for Power Supply on Chip

Comprehensive Design Procedure for Racetrack Microinductors

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