Power Electronics Reliability: State of the Art and Outlook

Wang, Huai; Blaabjerg, Frede

doi:10.1109/jestpe.2020.3037161

Cited by 76 publications

(44 citation statements)

References 101 publications

(241 reference statements)

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“…Meaning, that the end-of-life state is reached when the efficiency change of the converter caused by the combined component parameter shifts. A 20% increase in the forward voltage is chosen as this is consistent with the general consensus of the allowed degradation in existing studies [22], whereas a 2-3 times increase of the ESR of electrolytic capacitors are commonly used [5]. The number of components, which constitute each conversion stage and the maximum allowed individual parameter change are listed in TableI .…”

Section: Framework and Methodologymentioning

confidence: 99%

“…So in the case of a partially degraded data instance the sum of the dot product and the bias parameter will be equal to or larger to zero and in the opposite case less or equal to zero. Now by definition there will exist a least one set of values for w such that the function in (5) satisfies that y(x n ) > 0 for t n = 1 and y(x n ) < 0 for t n = −1, which conveniently leads to t n y(x n ) > 0 for all data instances.…”

Section: End-of-life Classifier Modellingmentioning

confidence: 99%

“…One common concern is the tendency of inherently base the prediction on one single failure mechanism, which is an idealistic assumption since in reality several failure mechanism could be co-existing and some could even be related in terms of sharing the driving forces that govern multiple failure mechanisms [4]. Furthermore, the extensive use of Miner's rule for linear damage accumulation is a simplistic assumption, as this does not consider the interactions that leads to positive feedback of the driving forces of failure causing the evolution of damage to accelerate as the components degrade [5]. Still, the major concern linked to PoF is the establishment of the useful life of the components by means of extrapolating the accelerated test results to other usage conditions in order to obtain the failure fatigue model parameters.…”

Section: Introductionmentioning

confidence: 99%

“…However, these mutual effects cannot be verified through the assumption that one single component degrades at a time and it would most certainly be a tedious affair, if not impossible, to estimate the health of every single component operating in the power converter. Also, due to the long and exhaustive process of locating and remedying any particular defect, it is highly unlikely that one component is replaced in case of component failure and it is therefore essential to monitor the health status of the entire converter using converter-level signals as alternative solutions [5]. This paper proposes a method, which utilizes the converter operating efficiency as a unified health precursor of the entire converter, and enables the assessment of the health status of the entire converter.…”

Section: Introductionmentioning

confidence: 99%

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End-of-Life Detection of Power Electronic Converters by Exploiting an Application-Level Health Precursor

Kjaer

Wang

Blaabjerg

2022

IEEE Open J. Power Electron.

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Extensive studies have been conducted in regards to estimating the useful life of power electronic converters in order to prevent failure related downtime. The state-of-the-art of converter reliability is based on the physics-of-failure approach, which involves some concerns such as the uncertainty introduced by extrapolating the accelerated test results to other usage conditions, which results in failure probability distributions inhibiting a variance of several years. In order to overcome this issue, the state-of-the-art is currently seeing an increase in research output, which are in favour of basing the reliability studies on physics-of-degradation based methods. The existing methods are restricted to only consider a single component and due to the impracticability of monitoring each single component, there is an essential need for methods, which can monitor the health state of the entire converter. This paper proposes a method which uses the converter operating efficiency to monitor parameter shifts of multiple components, which can be used to gain precision when stating the converter lifetime. A supervised classifier is used to detect the end-of-life while simultaneously coping with the fundamental issue of the loading influencing the efficiency. The method proves to have high accuracy even when measuring inaccuracies are taken into account.

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Section: Framework and Methodologymentioning

confidence: 99%

Section: End-of-life Classifier Modellingmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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End-of-Life Detection of Power Electronic Converters by Exploiting an Application-Level Health Precursor

Kjaer

Wang

Blaabjerg

2022

IEEE Open J. Power Electron.

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“…INTRODUCTIONWith increasingly pursuing higher efficiency and power density in power electronics, reliability has been becoming one of the major bottlenecks in this industry [1], [2], in particular of the high failure rate of power semiconductor devices [3]. To achieve a better performance, reliability evaluation has played an essential role in designs, manufacturing, and operation of today's power electronics [4], such as to reduce design margins [5], to plan maintenance schedules [6], [7] etc.…”

mentioning

confidence: 99%

A Novel Three-Pulse Equivalent Power Loss Profile for Simplified Thermal Estimation

Zhang

et al. 2021

IEEE J. Emerg. Sel. Topics Power Electron.

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One of the key challenges for long-term reliability analysis of power electronic converters is to quickly estimate extensive junction temperature cycles of power semiconductor devices while fulfilling an accepted accuracy. To address this challenge, this paper proposes a novel three-pulse equivalent power loss profile. By contrast to the conventional methods of dividing the power loss equally, this paper discretizes the power loss profile based on the identified occurrences of maximum and minimum junction temperatures (i.e., thermal Characteristics). This proposed model decouples the conventional conflict between the thermal estimation accuracy and computational burdens.And it has the advantages of improving accuracy in terms of the maximum and minimum junction temperatures, and power-on time of thermal profiles, which are majorly concerned by today's lifetime models of power semiconductors. Moreover, the proposed method also helps to reduce computational burdens. The relevant variables of the thermal modeling methods are investigated. Finally, the effectiveness of the proposed method is verified through simulation and experiments, and the impact of its thermal estimation advantages on lifetime evaluation is analyzed further. 1 Index Terms-Error analysis, equivalent power loss profile, junction temperature estimation, power semiconductor devices, thermal characteristics I. INTRODUCTIONWith increasingly pursuing higher efficiency and power density in power electronics, reliability has been becoming one of the major bottlenecks in this industry [1], [2], in particular of the high failure rate of power semiconductor devices [3]. To achieve a better performance, reliability evaluation has played an essential role in designs, manufacturing, and operation of today's power electronics [4], such as to reduce design margins [5], to plan maintenance schedules [6], [7] etc.

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The role of power device technology in the electric vehicle powertrain

Robles

Matallana

Aretxabaleta

et al. 2022

Intl J of Energy Research

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Summary In the automotive industry, the design and implementation of power converters and especially inverters, are at a turning point. Silicon (Si) IGBTs are at present the most widely used power semiconductors in most commercial vehicles. However, this trend is beginning to change with the appearance of wide‐bandgap (WBG) devices, particularly silicon carbide (SiC) and gallium nitride (GaN). It is therefore advisable to review their main features and advantages, to update the degree of their market penetration, and to identify the most commonly used alternatives in automotive inverters. In this paper, the aim is therefore to summarize the most relevant characteristics of power inverters, reviewing and providing a global overview of the most outstanding aspects (packages, semiconductor internal structure, stack‐ups, thermal considerations, etc.) of Si, SiC, and GaN power semiconductor technologies, and the degree of their use in electric vehicle powertrains. In addition, the paper also points out the trends that semiconductor technology and next‐generation inverters will be likely to follow, especially when future prospects point to the use of “800 V" battery systems and increased switching frequencies. The internal structure and the characteristics of the power modules are disaggregated, highlighting their thermal and electrical characteristics. In addition, aspects relating to reliability are considered, at both the discrete device and power module level, as well as more general issues that involve the entire propulsion system, such as common‐mode voltage.

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Power Electronics Reliability: State of the Art and Outlook

Cited by 76 publications

References 101 publications

End-of-Life Detection of Power Electronic Converters by Exploiting an Application-Level Health Precursor

End-of-Life Detection of Power Electronic Converters by Exploiting an Application-Level Health Precursor

A Novel Three-Pulse Equivalent Power Loss Profile for Simplified Thermal Estimation

The role of power device technology in the electric vehicle powertrain

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