2009
DOI: 10.1109/tie.2008.2002726
|View full text |Cite
|
Sign up to set email alerts
|

Power Electronics and Motor Drives Recent Progress and Perspective

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
137
0
1

Year Published

2009
2009
2021
2021

Publication Types

Select...
5
2
1

Relationship

0
8

Authors

Journals

citations
Cited by 364 publications
(147 citation statements)
references
References 47 publications
0
137
0
1
Order By: Relevance
“…Besides, IGBT modules are also the most sensitive elements to other system failures. For instance, dysfunctions on the IGBT drivers (Bouscayrol et al, 2006;Steimel, 2004), on the sensing elements to monitor the critical electrical and thermal variables of the inverter (Bose, 2006), on the cooling system (Baumann et al, 2001), and on the capacitors (decoupling or filter) (Malagoni-Buiatti et al, 2010) undoubtedly lead to their destruction (induced-failures). Furthermore, their working conditions can be more adverse when the IGBT power module wears out (Lhommeau et al, 2007), a non-optimum thermal management design has been carried out (Perpiñà et al, 2007a(Perpiñà et al, , 2010b, and external electrical dysfunctions occur (Malagoni-Buiatti et al, 2010).…”
Section: Failures Of Semiconductor Power Devices In Railway Traction mentioning
confidence: 99%
See 2 more Smart Citations
“…Besides, IGBT modules are also the most sensitive elements to other system failures. For instance, dysfunctions on the IGBT drivers (Bouscayrol et al, 2006;Steimel, 2004), on the sensing elements to monitor the critical electrical and thermal variables of the inverter (Bose, 2006), on the cooling system (Baumann et al, 2001), and on the capacitors (decoupling or filter) (Malagoni-Buiatti et al, 2010) undoubtedly lead to their destruction (induced-failures). Furthermore, their working conditions can be more adverse when the IGBT power module wears out (Lhommeau et al, 2007), a non-optimum thermal management design has been carried out (Perpiñà et al, 2007a(Perpiñà et al, , 2010b, and external electrical dysfunctions occur (Malagoni-Buiatti et al, 2010).…”
Section: Failures Of Semiconductor Power Devices In Railway Traction mentioning
confidence: 99%
“…However, multi-chip packaging introduces an apparent limitation on temperature local monitoring, since multiple devices are connected in parallel leading to temperature spatial resolution problems. Consequently, an average temperature measurement of all devices is always performed (Bose, 2006). Since any sensing method inside the package has not been envisaged by the manufacturers, usually TSPs are used for power cycling purposes, such as the V CE,sat at low current level (Coquery, 2003).…”
Section: Module Thermal Distribution Measurementsmentioning
confidence: 99%
See 1 more Smart Citation
“…The roots of power electronics go back to 1901 when P. C. Hewitt invented glass-bulb mercury-arc rectifier [1]. However, the present era of semiconductor power electronics started with the commercially introduced by General Electric (GE) silicon controlled rectifier (SCR), popularly called thyristor, in 1958.…”
Section: Introductionmentioning
confidence: 99%
“…Power Electronics on the other hand, deals with the electric energy conversion, and consequently one of the main concerns is efficiency. Although it is a relatively recent technology, its first developments can be dated in the mid 50's thanks to the commercialization of the SCR, its effects on our lives are everyday more and more important, because of its important reduction in cost, size and increase of performances [1]. The use of advanced control techniques, implemented in modern DSPs or DSP-FPGA combination, has made possible many of the desirable characteristics of modern power systems.…”
Section: Introductionmentioning
confidence: 99%