Epitaxially g r o w n large area Y B a~C u 3 0 7 --6 (YBCO) t h i n films are p r o m i s i n g for the application i n passive microwave devices (e.g. resonators, filters, antennas). T h e m a i n criteria for t h e s e applications are low microwave losses a n d good power h a n d l i n g capabilities of t h e devices.Various m e a s u r e m e n t t e c h n i q u e s are i n use for t h e evaluation of t h e power h a n d l i n g capabilities of YBCO t h i n films. However, only few studies exist relating t h e i r results to t h e actual p e r f o r m a n c e of t h e microwave devices. We investigate t h e rf field d e p e n d e n c e of t h e surface resistance of YBCO t h i n films using a dielectric resonator t e c h n i q u e at 8.5 GHz a n d 7 7 K. T h e lateral h o m o g e n e i t y of t h e films w i t h respect t o t h e surface resistance is a n a l y z e d w i t h a n o p e n resonator t e c h n i q u e at 145 GHz a n d 77 K. S u b s e q u e n t l y t h e films are p a t t e r n e d to microstrip resonators a n d t h e i r quality factors are m e a s u r e d at 4 GHz a n d 77 K as a function of t h e i n p u t rf power.T h e results s h o w t h a t t h e low values of the surface resist a n c e a n d i t s constant level u p to high rf m a g n e t i c fields ~1 0 m T are necessary r e q u i r e m e n t s b u t not s t r i n g e n t crit e r i a for good power h a n d l i n g capability of t h e microstrip resonators.