2012 4th Electronic System-Integration Technology Conference 2012
DOI: 10.1109/estc.2012.6542061
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Potential interconnect technologies for high power LEDs assemblies

Abstract: In this study, the reliability of several potential interconnect methods for high temperature applications are evaluated by using accelerated thermal cyclic tests on typical LED test carriers. The applied interconnect materials are SAC (Sn-Ag-Cu), SAC+(SAC with doping elements), and an eutectic AuSn solder alloy. The degradation behavior and typical failure modes in the different interconnect materials are analyzed at different test intervals. SAC+ shows better fatigue resistance than SAC based solder intercon… Show more

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Cited by 6 publications
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