2011
DOI: 10.1134/s1063782611040221
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Potential distribution in voltage terminating structures with floating p–n junction rings of silicon radiation detectors

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Cited by 4 publications
(8 citation statements)
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“…As was shown in studies of the mechanisms of the distribution of potentials over the detector's VTS before irradiation, the value of the electric field in the region of the inter ring gap is the most important fac tor, which determines the difference in potentials between neighboring rings [1]. Irradiation of silicon diode structures brings about the generation of radia tion defects with energy levels that affect the effective concentration N eff in the space charge region (SCR) and the corresponding profile of the electric field.…”
Section: Resultsmentioning
confidence: 96%
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“…As was shown in studies of the mechanisms of the distribution of potentials over the detector's VTS before irradiation, the value of the electric field in the region of the inter ring gap is the most important fac tor, which determines the difference in potentials between neighboring rings [1]. Irradiation of silicon diode structures brings about the generation of radia tion defects with energy levels that affect the effective concentration N eff in the space charge region (SCR) and the corresponding profile of the electric field.…”
Section: Resultsmentioning
confidence: 96%
“…In what follows, the sign of the space charge is changed from positive to negative, i.e., inversion of the space charge's sign takes place. The dependence of the effective concentration N eff on the dose of irradia tion with neutrons Φ can be calculated using the fol lowing parametric equation [2]: (1) here, N d0 is the effective concentration before irradia tion with N d0 = N eff (Φ = 0); γ = 8.8 × 10 -14 cm 2 is the coefficient of donor removal; and β = 0.022 cm -3 is the coefficient of acceptor introduction. According to Eq.…”
Section: Resultsmentioning
confidence: 99%
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