“…For CIGSSe/CISSe PV technology, the extrinsic (or foreign atom) elements alter and tune the: i) free carrier concentration, charge carrier diffusion length and lifetime, [ 136,137 ] ii) absorber growth (e.g., Ga and Cu depletion at the surface and changes in the intermixing of gallium and indium), [ 34,138–140 ] and morphology (e.g., morphological changes resulting in CdS (buffer layer) nucleation sites, and changes in the grain size), [ 25,59,67,141 ] iii) grain interior (GI, e.g., changes in the surface potential) and grain boundary (GB, e.g., decreased tail state formation due to reduced band bending), [ 51,55,59,120,121,142 ] iv) concentration of traps or deep levels, [ 132–134,143–147 ] and v) absorber surface (e.g., surface bandgap of KF‐treated CIGSSe absorbers are larger than that of untreated reference absorber layers), [ 25,71,89,148,149 ] without altering the parent diamond‐like tetragonal crystal structure. The use of extrinsic elements combined with bandgap engineering and optically wider buffer layers (compared to CdS) has boosted PCEs beyond 21.0%.…”